Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

Electrical failure of carbon nanotubes was investigated by obtaining I(V) data with a voltage ramp from a rope of multiwalled carbon nanotubes. Noncontact scanning force microscope images were obtained before and after each I(V) curve until electrical failure of the tube resulted. Following this procedure, it was possible to correlate a defect on the surface of a nanotube with the exact location of the tube failure.

Bibliography

de Pablo, P. J., Howell, S., Crittenden, S., Walsh, B., Graugnard, E., & Reifenberger, R. (1999). Correlating the location of structural defects with the electrical failure of multiwalled carbon nanotubes. Applied Physics Letters, 75(25), 3941–3943.

Authors 6
  1. P. J. de Pablo (first)
  2. S. Howell (additional)
  3. S. Crittenden (additional)
  4. B. Walsh (additional)
  5. E. Graugnard (additional)
  6. R. Reifenberger (additional)
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Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 9:29 a.m.)
Deposited 1 year, 6 months ago (Feb. 3, 2024, 12:20 p.m.)
Indexed 1 year ago (Aug. 12, 2024, 1:15 p.m.)
Issued 25 years, 8 months ago (Dec. 20, 1999)
Published 25 years, 8 months ago (Dec. 20, 1999)
Published Print 25 years, 8 months ago (Dec. 20, 1999)
Funders 0

None

@article{de_Pablo_1999, title={Correlating the location of structural defects with the electrical failure of multiwalled carbon nanotubes}, volume={75}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.125501}, DOI={10.1063/1.125501}, number={25}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={de Pablo, P. J. and Howell, S. and Crittenden, S. and Walsh, B. and Graugnard, E. and Reifenberger, R.}, year={1999}, month=dec, pages={3941–3943} }