Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

Using highly doped silicon-on-insulator (SOI) films, we demonstrate metallic Coulomb blockade in silicon nanowires at temperatures up to almost 100 K. We propose a process that leads to island formation inside the wire due to a combination of structural roughness and segregation effects during thermal oxidation. Hence, no narrowing of the SOI wire is necessary to form tunneling contacts to the single-electron transistors.

Bibliography

Tilke, A., Blick, R. H., Lorenz, H., Kotthaus, J. P., & Wharam, D. A. (1999). Coulomb blockade in quasimetallic silicon-on-insulator nanowires. Applied Physics Letters, 75(23), 3704–3706.

Authors 5
  1. A. Tilke (first)
  2. R. H. Blick (additional)
  3. H. Lorenz (additional)
  4. J. P. Kotthaus (additional)
  5. D. A. Wharam (additional)
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Dates
Type When
Created 23 years ago (July 26, 2002, 8:58 a.m.)
Deposited 1 year, 6 months ago (Feb. 3, 2024, 12:16 p.m.)
Indexed 4 months, 1 week ago (April 14, 2025, 12:26 a.m.)
Issued 25 years, 8 months ago (Dec. 6, 1999)
Published 25 years, 8 months ago (Dec. 6, 1999)
Published Print 25 years, 8 months ago (Dec. 6, 1999)
Funders 0

None

@article{Tilke_1999, title={Coulomb blockade in quasimetallic silicon-on-insulator nanowires}, volume={75}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.125435}, DOI={10.1063/1.125435}, number={23}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Tilke, A. and Blick, R. H. and Lorenz, H. and Kotthaus, J. P. and Wharam, D. A.}, year={1999}, month=dec, pages={3704–3706} }