Abstract
Using highly doped silicon-on-insulator (SOI) films, we demonstrate metallic Coulomb blockade in silicon nanowires at temperatures up to almost 100 K. We propose a process that leads to island formation inside the wire due to a combination of structural roughness and segregation effects during thermal oxidation. Hence, no narrowing of the SOI wire is necessary to form tunneling contacts to the single-electron transistors.
References
11
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Dates
Type | When |
---|---|
Created | 23 years ago (July 26, 2002, 8:58 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 12:16 p.m.) |
Indexed | 4 months, 1 week ago (April 14, 2025, 12:26 a.m.) |
Issued | 25 years, 8 months ago (Dec. 6, 1999) |
Published | 25 years, 8 months ago (Dec. 6, 1999) |
Published Print | 25 years, 8 months ago (Dec. 6, 1999) |
@article{Tilke_1999, title={Coulomb blockade in quasimetallic silicon-on-insulator nanowires}, volume={75}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.125435}, DOI={10.1063/1.125435}, number={23}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Tilke, A. and Blick, R. H. and Lorenz, H. and Kotthaus, J. P. and Wharam, D. A.}, year={1999}, month=dec, pages={3704–3706} }