Abstract
A phenomenological thermodynamic model has been developed to account for the effects of the film thickness on various properties of ferroelectric thin films. To this end, we have suitably incorporated a position-dependent stress distribution function into the elastic Gibbs function. Various physical properties can be predicted as a function of the film thickness using this modified thermodynamic formalism. A comparison of the theoretical predictions with experimental values of the average strain and the para-ferro transition temperature indicates that the tensile stress caused by the cubic-tetragonal displacive phase transition dominates over the compressive thermal stress in the epitaxially oriented tetragonal Pb(Zr, Ti)O3 thin films.
References
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:36 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 12:13 p.m.) |
Indexed | 2 months, 1 week ago (June 24, 2025, 7:28 a.m.) |
Issued | 25 years, 9 months ago (Nov. 15, 1999) |
Published | 25 years, 9 months ago (Nov. 15, 1999) |
Published Print | 25 years, 9 months ago (Nov. 15, 1999) |
@article{Kim_1999, title={Thermodynamic theory of stress distribution in epitaxial Pb(Zr, Ti)O3 thin films}, volume={75}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.125275}, DOI={10.1063/1.125275}, number={20}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Kim, H. Joon and Oh, S. Hoon and Jang, Hyun M.}, year={1999}, month=nov, pages={3195–3197} }