Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

A phenomenological thermodynamic model has been developed to account for the effects of the film thickness on various properties of ferroelectric thin films. To this end, we have suitably incorporated a position-dependent stress distribution function into the elastic Gibbs function. Various physical properties can be predicted as a function of the film thickness using this modified thermodynamic formalism. A comparison of the theoretical predictions with experimental values of the average strain and the para-ferro transition temperature indicates that the tensile stress caused by the cubic-tetragonal displacive phase transition dominates over the compressive thermal stress in the epitaxially oriented tetragonal Pb(Zr, Ti)O3 thin films.

Bibliography

Kim, H. J., Oh, S. H., & Jang, H. M. (1999). Thermodynamic theory of stress distribution in epitaxial Pb(Zr, Ti)O3 thin films. Applied Physics Letters, 75(20), 3195–3197.

Authors 3
  1. H. Joon Kim (first)
  2. S. Hoon Oh (additional)
  3. Hyun M. Jang (additional)
References 8 Referenced 66
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  7. {'key': '2024020317132315400_r7'}
  8. 10.1111/j.1151-2916.1989.tb09697.x / J. Am. Ceram. Soc. (1989)
Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 9:36 a.m.)
Deposited 1 year, 6 months ago (Feb. 3, 2024, 12:13 p.m.)
Indexed 2 months, 1 week ago (June 24, 2025, 7:28 a.m.)
Issued 25 years, 9 months ago (Nov. 15, 1999)
Published 25 years, 9 months ago (Nov. 15, 1999)
Published Print 25 years, 9 months ago (Nov. 15, 1999)
Funders 0

None

@article{Kim_1999, title={Thermodynamic theory of stress distribution in epitaxial Pb(Zr, Ti)O3 thin films}, volume={75}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.125275}, DOI={10.1063/1.125275}, number={20}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Kim, H. Joon and Oh, S. Hoon and Jang, Hyun M.}, year={1999}, month=nov, pages={3195–3197} }