DOI: 10.1063/1.125216. Quantitative microwave evanescent microscopy

Quantitative microwave evanescent microscopy

10.1063/1.125216

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

We have developed a scanning evanescent microwave microscope with shielded tip geometry allowing quantitative characterization of the electrical impedance of insulating and conducting materials. By modeling the tip–sample capacitance, quantitative estimates of the sample (both dielectric and conducting) electrical impedance (real and imaginary) and tip–sample separation can be made. Measurements of the tip–sample capacitance versus tip–sample separation have been made and agree with estimated values. Also, the slope of the tip–sample capacitance with respect to the tip–sample distance is calculated to implement tip–sample distance regulation for dielectric materials.

Bibliography

Gao, C., Duewer, F., & Xiang, X.-D. (1999). Quantitative microwave evanescent microscopy. Applied Physics Letters, 75(19), 3005â3007.

Authors 3

Chen Gao (first)
Fred Duewer (additional)
X.-D. Xiang (additional)

References 16 Referenced 46

10.1080/14786440808564615 / Philos. Mag. (1928)
10.1063/1.1728690 / J. Appl. Phys. (1962)
10.1038/237510a0 / Nature (London) (1972)
10.1063/1.94865 / Appl. Phys. Lett. (1984)
{'key': '2024020317083378400_r5', 'first-page': '405a', 'volume': '41', 'year': '1983', 'journal-title': 'Biophys. J.'} / Biophys. J. (1983)
10.1103/PhysRevLett.49.57 / Phys. Rev. Lett. (1982)
10.1103/PhysRevLett.56.930 / Phys. Rev. Lett. (1986)
{'key': '2024020317083378400_r7a'}
{'key': '2024020317083378400_r8', 'first-page': '657', 'volume': '59', 'year': '1997', 'journal-title': 'Rep. Prog. Phys.'} / Rep. Prog. Phys. (1997)
10.1126/science.276.5312.579 / Science (1997)
10.1063/1.106940 / Appl. Phys. Lett. (1992)
10.1063/1.106801 / Appl. Phys. Lett. (1992)
10.1063/1.1149189 / Rev. Sci. Instrum. (1998)
10.1063/1.120444 / Appl. Phys. Lett. (1997)
{'key': '2024020317083378400_r14'}
10.1103/PhysRev.31.900 / Phys. Rev. (1928)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:36 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 12:08 p.m.)
Indexed	1 year ago (Aug. 14, 2024, 6:29 a.m.)
Issued	25 years, 9 months ago (Nov. 8, 1999)
Published	25 years, 9 months ago (Nov. 8, 1999)
Published Print	25 years, 9 months ago (Nov. 8, 1999)

Funders 0

None

BibTeX

@article{Gao_1999, title={Quantitative microwave evanescent microscopy}, volume={75}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.125216}, DOI={10.1063/1.125216}, number={19}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Gao, Chen and Duewer, Fred and Xiang, X.-D.}, year={1999}, month=nov, pages={3005–3007} }

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