Abstract
The Ga2O3(Gd2O3) dielectric film was previously discovered to passivate the GaAs surface effectively. We have investigated the systematic dependence of the dielectric properties of (Ga2O3)1−x(Gd2O3)x on the Gd (x) content. Our results show that pure Ga2O3 does not passivate GaAs. Films with x⩾14% are electrically insulating with low leakage current and high electrical breakdown strength. Furthermore, a low interfacial density of states was attained in films with x⩾14%. The results show the important role of Gd2O3 in the (Ga2O3)1−x(Gd2O3)x dielectric films for effective passivation of GaAs.
References
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:29 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 3, 2024, 11:46 a.m.) |
Indexed | 5 months, 2 weeks ago (March 22, 2025, 4:31 a.m.) |
Issued | 26 years ago (Aug. 23, 1999) |
Published | 26 years ago (Aug. 23, 1999) |
Published Print | 26 years ago (Aug. 23, 1999) |
@article{Kwo_1999, title={Passivation of GaAs using (Ga2O3)1−x(Gd2O3)x, 0⩽x⩽1.0 films}, volume={75}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.124614}, DOI={10.1063/1.124614}, number={8}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Kwo, J. and Murphy, D. W. and Hong, M. and Opila, R. L. and Mannaerts, J. P. and Sergent, A. M. and Masaitis, R. L.}, year={1999}, month=aug, pages={1116–1118} }