DOI: 10.1063/1.124487. Interface and tunneling barrier heights of NbN/AlN/NbN tunnel junctions

Interface and tunneling barrier heights of NbN/AlN/NbN tunnel junctions

10.1063/1.124487

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

The tunneling barrier height of NbN/AlN/NbN tunnel junctions was measured by investigating the barrier thickness dependence of the current density, and the junction interface was studied by cross-sectional transmission electron microscopy (TEM). We found that the current density of the junctions has two distinct types of dependency on the AlN barrier thickness, corresponding to two average barrier heights in different regions for the current density. The TEM observations showed that the junctions had a very smooth and clear electrode–barrier interface, and the crystal structures of the counterelectrode NbN films were strongly dependent on the thickness of AlN barriers. The average barrier height was estimated to be 2.35 eV in the low-Jc region, Jc&lt;5 kA/cm2, and to be 0.88 eV in the high-Jc region, Jc&gt;5 kA/cm2.

Bibliography

Wang, Z., Terai, H., Kawakami, A., & Uzawa, Y. (1999). Interface and tunneling barrier heights of NbN/AlN/NbN tunnel junctions. Applied Physics Letters, 75(5), 701â703.

Authors 4

Zhen Wang (first)
Hirotaka Terai (additional)
Akira Kawakami (additional)
Yoshinori Uzawa (additional)

References 24 Referenced 68

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Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:29 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 11:37 a.m.)
Indexed	2 weeks, 6 days ago (Aug. 6, 2025, 8:24 a.m.)
Issued	26 years ago (Aug. 2, 1999)
Published	26 years ago (Aug. 2, 1999)
Published Print	26 years ago (Aug. 2, 1999)

Funders 0

None

BibTeX

@article{Wang_1999, title={Interface and tunneling barrier heights of NbN/AlN/NbN tunnel junctions}, volume={75}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.124487}, DOI={10.1063/1.124487}, number={5}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Wang, Zhen and Terai, Hirotaka and Kawakami, Akira and Uzawa, Yoshinori}, year={1999}, month=aug, pages={701–703} }

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