Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

Ultrathin, high-sensitivity piezoresistive cantilevers were constructed using vapor-phase epitaxy to grow the conducting layer. A fourfold reduction in thickness was achieved over the thinnest implanted piezoresistive cantilevers, allowing improved force or displacement sensitivity and increased bandwidth. In cantilevers 890 Å thick, the dopant is well confined to the surface, and the sensitivity is 70% of the theoretical maximum. A cantilever fabricated for high force resolution has a minimum detectable force of 8.6 fN/Hz in air. Additionally, the 1/f noise is shown to follow the relation proposed by Hooge [Phys. Lett A 29, 139 (1969)], increasing in inverse proportion to the number of carriers.

Bibliography

Harley, J. A., & Kenny, T. W. (1999). High-sensitivity piezoresistive cantilevers under 1000 Å thick. Applied Physics Letters, 75(2), 289–291.

Authors 2
  1. J. A. Harley (first)
  2. T. W. Kenny (additional)
References 15 Referenced 162
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Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 8:42 a.m.)
Deposited 1 year, 6 months ago (Feb. 3, 2024, 11:33 a.m.)
Indexed 2 months, 2 weeks ago (June 10, 2025, 2:44 p.m.)
Issued 26 years, 1 month ago (July 12, 1999)
Published 26 years, 1 month ago (July 12, 1999)
Published Print 26 years, 1 month ago (July 12, 1999)
Funders 0

None

@article{Harley_1999, title={High-sensitivity piezoresistive cantilevers under 1000 Å thick}, volume={75}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.124350}, DOI={10.1063/1.124350}, number={2}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Harley, J. A. and Kenny, T. W.}, year={1999}, month=jul, pages={289–291} }