DOI: 10.1063/1.124148. Measurement of induced surface charges, contact potentials, and surface states in GaN by electric force microscopy

Measurement of induced surface charges, contact potentials, and surface states in GaN by electric force microscopy

10.1063/1.124148

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

We have studied molecular beam epitaxy grown GaN films of both polarities using electric force microscopy to detect sub 1 μm regions of charge density variations associated with GaN extended defects. The large piezoelectric coefficients of GaN together with strain introduced by crystalline imperfections produce variations in piezoelectrically induced electric fields around these defects. The consequent spatial rearrangement of charges can be detected by electrostatic force microscopy and was found to be on the order of the characteristic Debye length for GaN at our dopant concentration. The electric force microscope signal was also found to be a linear function of the contact potential between the metal coating on the tip and GaN. Electrostatic analysis yielded a surface state density of 9.4±0.5×1010 cm−2 at an energy of 30 mV above the valence band indicating that the GaN surface is unpinned in this case.

Bibliography

Bridger, P. M., BandiÄ, Z. Z., Piquette, E. C., & McGill, T. C. (1999). Measurement of induced surface charges, contact potentials, and surface states in GaN by electric force microscopy. Applied Physics Letters, 74(23), 3522â3524.

Authors 4

P. M. Bridger (first)
Z. Z. Bandić (additional)
E. C. Piquette (additional)
T. C. McGill (additional)

References 23 Referenced 76

10.1063/1.118593 / Appl. Phys. Lett. (1997)
{'key': '2024020316181830400_r2', 'first-page': '69', 'volume': 'B46', 'year': '1997', 'journal-title': 'Mater. Sci. Eng., B'} / Mater. Sci. Eng., B (1997)
10.1016/S0079-6727(96)00002-X / Prog. Quantum Electron. (1996)
10.1016/S0038-1101(98)00227-5 / Solid-State Electron. (1998)
10.1063/1.118838 / Appl. Phys. Lett. (1997)
10.1002/1521-3951(199711)204:1<133::AID-PSSB133>3.0.CO;2-E / Phys. Status Solidi B (1997)
10.1063/1.355070 / J. Appl. Phys. (1993)
{'key': '2024020316181830400_r8', 'first-page': '2794', 'volume': '71', 'year': '1998', 'journal-title': 'Appl. Phys. Lett.'} / Appl. Phys. Lett. (1998)
10.1063/1.99224 / Appl. Phys. Lett. (1988)
{'key': '2024020316181830400_r10'}
10.1063/1.121293 / Appl. Phys. Lett. (1998)
10.1063/1.120163 / Appl. Phys. Lett. (1997)
{'key': '2024020316181830400_r13'}
{'key': '2024020316181830400_r14'}
10.1557/PROC-512-387 / Mater. Res. Soc. Symp. Proc. (1998)
10.1063/1.1148251 / Rev. Sci. Instrum. (1997)
10.1063/1.105227 / Appl. Phys. Lett. (1991)
10.1016/S0038-1101(98)00099-9 / Solid-State Electron. (1998)
10.1063/1.103122 / Appl. Phys. Lett. (1990)
{'key': '2024020316181830400_r20'}
{'key': '2024020316181830400_r21', 'first-page': '787', 'volume': '482', 'year': '1998', 'journal-title': 'Mater. Res. Soc. Symp. Proc.'} / Mater. Res. Soc. Symp. Proc. (1998)
{'key': '2024020316181830400_r22', 'first-page': '787', 'volume': '449', 'year': '1998', 'journal-title': 'Mater. Res. Soc. Symp. Proc.'} / Mater. Res. Soc. Symp. Proc. (1998)
10.1103/PhysRevB.28.2060 / Phys. Rev. B (1983)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:31 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 11:18 a.m.)
Indexed	1 year, 6 months ago (Feb. 11, 2024, 7:26 a.m.)
Issued	26 years, 2 months ago (June 7, 1999)
Published	26 years, 2 months ago (June 7, 1999)
Published Print	26 years, 2 months ago (June 7, 1999)

Funders 0

None

BibTeX

@article{Bridger_1999, title={Measurement of induced surface charges, contact potentials, and surface states in GaN by electric force microscopy}, volume={74}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.124148}, DOI={10.1063/1.124148}, number={23}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Bridger, P. M. and Bandić, Z. Z. and Piquette, E. C. and McGill, T. C.}, year={1999}, month=jun, pages={3522–3524} }

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