DOI: 10.1063/1.123983. Potential imaging of operating light-emitting devices using Kelvin force microscopy

Potential imaging of operating light-emitting devices using Kelvin force microscopy

10.1063/1.123983

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

We report on the measurements of two-dimensional potential distribution with nanometer spatial resolution of operating light-emitting diodes. By measuring the contact potential difference between an atomic force microscope tip and the cleaved surface of the light emitting diode, we were able to measure the device potential distribution under different applied external bias. It is shown that the junction built-in voltage at the surface decreases with increasing applied forward bias up to flatband conditions, and then inverted. It is found that the potential distribution is governed by self-absorption of the sub-band-gap diode emission.

Bibliography

Shikler, R., Meoded, T., Fried, N., & Rosenwaks, Y. (1999). Potential imaging of operating light-emitting devices using Kelvin force microscopy. Applied Physics Letters, 74(20), 2972â2974.

Authors 4

R. Shikler (first)
T. Meoded (additional)
N. Fried (additional)
Y. Rosenwaks (additional)

References 8 Referenced 80

{'key': '2024020316123679200_r1', 'first-page': '2091', 'volume': '58', 'year': '1991', 'journal-title': 'Appl. Phys. Lett.'} / Appl. Phys. Lett. (1991)
10.1063/1.113780 / Appl. Phys. Lett. (1995)
{'key': '2024020316123679200_r3', 'first-page': '2358', 'volume': '77', 'year': '1995', 'journal-title': 'Appl. Phys. Lett.'} / Appl. Phys. Lett. (1995)
10.1063/1.114344 / Appl. Phys. Lett. (1995)
10.1109/55.622517 / IEEE Electron Device Lett. (1997)
10.1063/1.98877 / Appl. Phys. Lett. (1987)
{'key': '2024020316123679200_r7'}
10.1007/BF02659702 / J. Electron. Mater. (1995)

Dates

Type	When
Created	23 years ago (July 26, 2002, 9:31 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 11:12 a.m.)
Indexed	2 weeks, 1 day ago (Aug. 6, 2025, 8:35 a.m.)
Issued	26 years, 3 months ago (May 17, 1999)
Published	26 years, 3 months ago (May 17, 1999)
Published Print	26 years, 3 months ago (May 17, 1999)

Funders 0

None

BibTeX

@article{Shikler_1999, title={Potential imaging of operating light-emitting devices using Kelvin force microscopy}, volume={74}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.123983}, DOI={10.1063/1.123983}, number={20}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Shikler, R. and Meoded, T. and Fried, N. and Rosenwaks, Y.}, year={1999}, month=may, pages={2972–2974} }

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