DOI: 10.1063/1.123923. Atomic force microscopy of work functions on the nanometer scale

Atomic force microscopy of work functions on the nanometer scale

10.1063/1.123923

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

The Kelvin probe force microscope, introduced some years ago, has opened up several avenues of investigation. In this letter, we demonstrate that the technique is capable of distinguishing constituents of a metal alloy through their work-function differences. The intermetallics in the alloy are clearly resolved. We discuss the basic principles of the measurement technique and present our results on aluminum/copper surfaces. The limits of the technique are also discussed.

Bibliography

OâBoyle, M. P., Hwang, T. T., & Wickramasinghe, H. K. (1999). Atomic force microscopy of work functions on the nanometer scale. Applied Physics Letters, 74(18), 2641â2642.

Authors 3

M. P. O’Boyle (first)
T. T. Hwang (additional)
H. K. Wickramasinghe (additional)

References 13 Referenced 29

{'key': '2024020316055543100_r1'}
{'key': '2024020316055543100_r2'}
10.1126/science.251.5000.1468 / Science (1991)
10.1063/1.111903 / Appl. Phys. Lett. (1994)
10.1116/1.585564 / J. Vac. Sci. Technol. B (1991)
10.1038/344317a0 / Nature (London) (1990)
10.1063/1.105227 / Appl. Phys. Lett. (1991)
10.1016/0040-6090(95)06772-8 / Thin Solid Films (1996)
10.1143/JJAP.34.3403 / Jpn. J. Appl. Phys., Part 1 (1995)
10.1063/1.113780 / Appl. Phys. Lett. (1995)
10.1116/1.587242 / J. Vac. Sci. Technol. B (1994)
10.1063/1.338807 / J. Appl. Phys. (1987)
10.1063/1.355403 / J. Appl. Phys. (1994)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:31 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 11:06 a.m.)
Indexed	1 year, 1 month ago (June 30, 2024, 4:28 p.m.)
Issued	26 years, 3 months ago (May 3, 1999)
Published	26 years, 3 months ago (May 3, 1999)
Published Print	26 years, 3 months ago (May 3, 1999)

Funders 0

None

BibTeX

@article{O_Boyle_1999, title={Atomic force microscopy of work functions on the nanometer scale}, volume={74}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.123923}, DOI={10.1063/1.123923}, number={18}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={O’Boyle, M. P. and Hwang, T. T. and Wickramasinghe, H. K.}, year={1999}, month=may, pages={2641–2642} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        6,
        30
      ]
    ],
    "date-time": "2024-06-30T20:28:08Z",
    "timestamp": 1719779288254
  },
  "reference-count": 13,
  "publisher": "AIP Publishing",
  "issue": "18",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        1999,
        5,
        3
      ]
    ]
  },
  "abstract": "<jats:p>The Kelvin probe force microscope, introduced some years ago, has opened up several avenues of investigation. In this letter, we demonstrate that the technique is capable of distinguishing constituents of a metal alloy through their work-function differences. The intermetallics in the alloy are clearly resolved. We discuss the basic principles of the measurement technique and present our results on aluminum/copper surfaces. The limits of the technique are also discussed.</jats:p>",
  "DOI": "10.1063/1.123923",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2002,
        7,
        26
      ]
    ],
    "date-time": "2002-07-26T13:31:28Z",
    "timestamp": 1027690288000
  },
  "page": "2641-2642",
  "update-policy": "http://dx.doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 29,
  "title": "Atomic force microscopy of work functions on the nanometer scale",
  "prefix": "10.1063",
  "volume": "74",
  "author": [
    {
      "given": "M. P.",
      "family": "O\u2019Boyle",
      "sequence": "first",
      "affiliation": [
        {
          "name": "IBM T. J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York\u200910598"
        }
      ]
    },
    {
      "given": "T. T.",
      "family": "Hwang",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "IBM T. J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York\u200910598"
        }
      ]
    },
    {
      "given": "H. K.",
      "family": "Wickramasinghe",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "IBM T. J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York\u200910598"
        }
      ]
    }
  ],
  "member": "317",
  "reference": [
    {
      "key": "2024020316055543100_r1"
    },
    {
      "key": "2024020316055543100_r2"
    },
    {
      "key": "2024020316055543100_r3",
      "doi-asserted-by": "crossref",
      "first-page": "1468",
      "DOI": "10.1126/science.251.5000.1468",
      "volume": "251",
      "year": "1991",
      "journal-title": "Science"
    },
    {
      "key": "2024020316055543100_r4",
      "doi-asserted-by": "crossref",
      "first-page": "1421",
      "DOI": "10.1063/1.111903",
      "volume": "64",
      "year": "1994",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2024020316055543100_r5",
      "doi-asserted-by": "crossref",
      "first-page": "541",
      "DOI": "10.1116/1.585564",
      "volume": "9",
      "year": "1991",
      "journal-title": "J. Vac. Sci. Technol. B"
    },
    {
      "key": "2024020316055543100_r6",
      "doi-asserted-by": "crossref",
      "first-page": "317",
      "DOI": "10.1038/344317a0",
      "volume": "344",
      "year": "1990",
      "journal-title": "Nature (London)"
    },
    {
      "key": "2024020316055543100_r7",
      "doi-asserted-by": "crossref",
      "first-page": "2921",
      "DOI": "10.1063/1.105227",
      "volume": "58",
      "year": "1991",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2024020316055543100_r8",
      "doi-asserted-by": "crossref",
      "first-page": "279",
      "DOI": "10.1016/0040-6090(95)06772-8",
      "volume": "273",
      "year": "1996",
      "journal-title": "Thin Solid Films"
    },
    {
      "key": "2024020316055543100_r9",
      "doi-asserted-by": "crossref",
      "first-page": "3403",
      "DOI": "10.1143/JJAP.34.3403",
      "volume": "34",
      "year": "1995",
      "journal-title": "Jpn. J. Appl. Phys., Part 1"
    },
    {
      "key": "2024020316055543100_r10",
      "doi-asserted-by": "crossref",
      "first-page": "3510",
      "DOI": "10.1063/1.113780",
      "volume": "66",
      "year": "1995",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2024020316055543100_r11",
      "doi-asserted-by": "crossref",
      "first-page": "1604",
      "DOI": "10.1116/1.587242",
      "volume": "12",
      "year": "1994",
      "journal-title": "J. Vac. Sci. Technol. B"
    },
    {
      "key": "2024020316055543100_r12",
      "doi-asserted-by": "crossref",
      "first-page": "4723",
      "DOI": "10.1063/1.338807",
      "volume": "61",
      "year": "1987",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2024020316055543100_r13",
      "doi-asserted-by": "crossref",
      "first-page": "6211",
      "DOI": "10.1063/1.355403",
      "volume": "75",
      "year": "1994",
      "journal-title": "J. Appl. Phys."
    }
  ],
  "container-title": "Applied Physics Letters",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/74/18/2641/18541263/2641_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/74/18/2641/18541263/2641_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2024,
        2,
        3
      ]
    ],
    "date-time": "2024-02-03T16:06:09Z",
    "timestamp": 1706976369000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/apl/article/74/18/2641/72296/Atomic-force-microscopy-of-work-functions-on-the"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1999,
        5,
        3
      ]
    ]
  },
  "references-count": 13,
  "journal-issue": {
    "issue": "18",
    "published-print": {
      "date-parts": [
        [
          1999,
          5,
          3
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.123923",
  "relation": {},
  "ISSN": [
    "0003-6951",
    "1077-3118"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        1999,
        5,
        3
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        1999,
        5,
        3
      ]
    ]
  }
}