Abstract
Thin films of Li-doped ZnO of different compositions (Zn1−xLix)O, x=0.1, 0.17, and 0.3 have been prepared on Si(100) substrates, with no buffer layer, by the pulsed laser deposition method. Ferroelectric behavior with a memory window of 1.2 V has been observed in capacitance–voltage measurements. The peak maximum in the capacitance–temperature curve suggests that the ferroelectric phase transition occurs around 340 K.
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Dates
Type | When |
---|---|
Created | 23 years ago (July 26, 2002, 9:31 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 11:04 a.m.) |
Indexed | 4 months, 3 weeks ago (April 1, 2025, 1:01 p.m.) |
Issued | 26 years, 3 months ago (April 26, 1999) |
Published | 26 years, 3 months ago (April 26, 1999) |
Published Print | 26 years, 3 months ago (April 26, 1999) |
@article{Joseph_1999, title={Ferroelectric behavior of Li-doped ZnO thin films on Si(100) by pulsed laser deposition}, volume={74}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.123889}, DOI={10.1063/1.123889}, number={17}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Joseph, M. and Tabata, H. and Kawai, T.}, year={1999}, month=apr, pages={2534–2536} }