Abstract
We present the fabrication and characterization of nonintentionally doped GaN and GaN:Mg Schottky metal–semiconductor–metal (MSM) photodetectors, grown on sapphire by metalorganic chemical vapor deposition. Low-leakage, Schottky contacts were made with Pt/Au. The devices are visible blind, with an ultraviolet/green contrast of about five orders of magnitude. The response times of the MSM devices were <10 ns and about 200 ns for GaN and GaN:Mg, respectively. The noise power spectral density remains below the background level of the system (10−24 A2/Hz) up to 5 V, for the undoped GaN MSM detector.
References
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:36 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 10:39 a.m.) |
Indexed | 4 weeks, 2 days ago (July 27, 2025, 3:13 a.m.) |
Issued | 26 years, 6 months ago (Feb. 1, 1999) |
Published | 26 years, 6 months ago (Feb. 1, 1999) |
Published Print | 26 years, 6 months ago (Feb. 1, 1999) |
@article{Walker_1999, title={High-speed, low-noise metal–semiconductor–metal ultraviolet photodetectors based on GaN}, volume={74}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.123303}, DOI={10.1063/1.123303}, number={5}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Walker, D. and Monroy, E. and Kung, P. and Wu, J. and Hamilton, M. and Sanchez, F. J. and Diaz, J. and Razeghi, M.}, year={1999}, month=feb, pages={762–764} }