DOI: 10.1063/1.123133. Femtosecond near-field optical spectroscopy of implantation patterned semiconductors

Femtosecond near-field optical spectroscopy of implantation patterned semiconductors

10.1063/1.123133

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

We have developed a femtosecond-resolved near-field scanning optical microscope, using a diffraction-limited pump and near-field probe configuration, which allows us to measure carrier dynamics with a spatial resolution of ∼150 nm and a time resolution of ∼250 fs. This instrument is used for near-field degenerate pump–probe studies of carrier dynamics in GaAs/AlGaAs single quantum well samples locally patterned by focused-ion-beam (FIB) implantation. We find that lateral carrier diffusion across the nanometer-scale FIB pattern plays a significant role in the decay of the excited carriers.

Bibliography

Nechay, B. A., Siegner, U., Morier-Genoud, F., Schertel, A., & Keller, U. (1999). Femtosecond near-field optical spectroscopy of implantation patterned semiconductors. Applied Physics Letters, 74(1), 61â63.

Authors 5

B. A. Nechay (first)
U. Siegner (additional)
F. Morier-Genoud (additional)
A. Schertel (additional)
U. Keller (additional)

References 14 Referenced 50

{'key': '2024020315302543300_r1'}
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{'key': '2024020315302543300_r4', 'first-page': '82', 'volume': '16', 'year': '1995', 'journal-title': 'Tech. Dig. Ser. Conf. Ed.'} / Tech. Dig. Ser. Conf. Ed. (1995)
10.1016/S0304-3991(97)00062-4 / Ultramicroscopy (1998)
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10.1063/1.113340 / Appl. Phys. Lett. (1995)
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{'key': '2024020315302543300_r10'}
10.1063/1.363956 / J. Appl. Phys. (1997)
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Dates

Type	When
Created	23 years ago (July 26, 2002, 9:31 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 10:30 a.m.)
Indexed	1 year, 6 months ago (Feb. 19, 2024, 2:04 p.m.)
Issued	26 years, 7 months ago (Jan. 4, 1999)
Published	26 years, 7 months ago (Jan. 4, 1999)
Published Print	26 years, 7 months ago (Jan. 4, 1999)

Funders 0

None

BibTeX

@article{Nechay_1999, title={Femtosecond near-field optical spectroscopy of implantation patterned semiconductors}, volume={74}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.123133}, DOI={10.1063/1.123133}, number={1}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Nechay, B. A. and Siegner, U. and Morier-Genoud, F. and Schertel, A. and Keller, U.}, year={1999}, month=jan, pages={61–63} }

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