Abstract
The optical properties of lattice-matched GaAsSb/InGaAs/InP heterostructures with a varying InGaAs layer thickness (0–900 Å) were investigated. These structures display strong low temperature type II luminescence, the energy of which varies with the InGaAs layer thickness and ranges from 0.453 to 0.63 eV. The type II luminescence was used to determine directly and accurately the conduction band offset of these structures. The values obtained herein are 0.36 and 0.18 eV at 4.2 K for the GaAsSb/InGaAs and GaAsSb/InP heterojunctions, respectively, with the GaAsSb conduction band higher in energy.
Bibliography
Hu, J., Xu, X. G., Stotz, J. A. H., Watkins, S. P., Curzon, A. E., Thewalt, M. L. W., Matine, N., & Bolognesi, C. R. (1998). Type II photoluminescence and conduction band offsets of GaAsSb/InGaAs and GaAsSb/InP heterostructures grown by metalorganic vapor phase epitaxy. Applied Physics Letters, 73(19), 2799â2801.
References
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:36 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 3, 2024, 10:13 a.m.) |
Indexed | 2 months, 3 weeks ago (June 15, 2025, 10:01 p.m.) |
Issued | 26 years, 9 months ago (Nov. 9, 1998) |
Published | 26 years, 9 months ago (Nov. 9, 1998) |
Published Print | 26 years, 9 months ago (Nov. 9, 1998) |
@article{Hu_1998, title={Type II photoluminescence and conduction band offsets of GaAsSb/InGaAs and GaAsSb/InP heterostructures grown by metalorganic vapor phase epitaxy}, volume={73}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.122594}, DOI={10.1063/1.122594}, number={19}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Hu, J. and Xu, X. G. and Stotz, J. A. H. and Watkins, S. P. and Curzon, A. E. and Thewalt, M. L. W. and Matine, N. and Bolognesi, C. R.}, year={1998}, month=nov, pages={2799–2801} }