Abstract
Atomic-resolution Z-contrast images demonstrate unambiguously that the annealed, metalorganic chemical vapor deposition derived transparent In2O3–ZnO films have a polytypoid microstructure, consisting of ZnO slabs of variable width separated by single In–O octahedral layers. These In–O layers induce a polarity inversion in the two adjacent ZnO layers, which is reversed again by a mirror domain boundary inside each ZnO slab.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:36 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 2, 2024, 4:21 p.m.) |
Indexed | 1 week, 4 days ago (Aug. 23, 2025, 12:58 a.m.) |
Issued | 26 years, 10 months ago (Nov. 2, 1998) |
Published | 26 years, 10 months ago (Nov. 2, 1998) |
Published Print | 26 years, 10 months ago (Nov. 2, 1998) |
@article{Yan_1998, title={Polytypoid structures in annealed In2O3–ZnO films}, volume={73}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.122513}, DOI={10.1063/1.122513}, number={18}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Yan, Y. and Pennycook, S. J. and Dai, J. and Chang, R. P. H. and Wang, A. and Marks, T. J.}, year={1998}, month=nov, pages={2585–2587} }