DOI: 10.1063/1.122359. Ferromagnetic resonance force microscopy on microscopic cobalt single layer films

Ferromagnetic resonance force microscopy on microscopic cobalt single layer films

10.1063/1.122359

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

We report mechanical detection of ferromagnetic resonance (FMR) signals from microscopic Co single layer thin films using a magnetic resonance force microscope (MRFM). Variations in the magnetic anisotropy field and the inhomogeneity of were clearly observed in the FMR spectra of microscopic Co thin films 500 and 1000 Å thick and ∼40×200 μm2 in lateral extent. This demonstrates the important potential that MRFM detection of FMR holds for microscopic characterization of spatial distribution of magnetic properties in magnetic layered materials and devices.

Bibliography

Zhang, Z., Hammel, P. C., Midzor, M., Roukes, M. L., & Childress, J. R. (1998). Ferromagnetic resonance force microscopy on microscopic cobalt single layer films. Applied Physics Letters, 73(14), 2036â2038.

Authors 5

Z. Zhang (first)
P. C. Hammel (additional)
M. Midzor (additional)
M. L. Roukes (additional)
J. R. Childress (additional)

References 13 Referenced 41

{'key': '2024020315034519800_r1'}
{'key': '2024020315034519800_r2'}
10.1063/1.115619 / Appl. Phys. Lett. (1996)
10.1038/360563a0 / Nature (London) (1992)
10.1126/science.264.5165.1560 / Science (1994)
10.1063/1.104757 / Appl. Phys. Lett. (1991)
10.1103/PhysRevLett.68.1124 / Phys. Rev. Lett. (1992)
10.1063/1.355403 / J. Appl. Phys. (1994)
10.1007/BF00754562 / J. Low Temp. Phys. (1995)
10.1063/1.1142418 / Rev. Sci. Instrum. (1991)
10.1063/1.1147967 / Rev. Sci. Instrum. (1997)
10.1063/1.1145567 / Rev. Sci. Instrum. (1995)
{'key': '2024020315034519800_r13'}

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 8:49 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 10:03 a.m.)
Indexed	1 year, 6 months ago (Feb. 11, 2024, 2:57 a.m.)
Issued	26 years, 10 months ago (Oct. 5, 1998)
Published	26 years, 10 months ago (Oct. 5, 1998)
Published Print	26 years, 10 months ago (Oct. 5, 1998)

Funders 0

None

BibTeX

@article{Zhang_1998, title={Ferromagnetic resonance force microscopy on microscopic cobalt single layer films}, volume={73}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.122359}, DOI={10.1063/1.122359}, number={14}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Zhang, Z. and Hammel, P. C. and Midzor, M. and Roukes, M. L. and Childress, J. R.}, year={1998}, month=oct, pages={2036–2038} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        2,
        11
      ]
    ],
    "date-time": "2024-02-11T07:57:32Z",
    "timestamp": 1707638252533
  },
  "reference-count": 13,
  "publisher": "AIP Publishing",
  "issue": "14",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        1998,
        10,
        5
      ]
    ]
  },
  "abstract": "<jats:p>We report mechanical detection of ferromagnetic resonance (FMR) signals from microscopic Co single layer thin films using a magnetic resonance force microscope (MRFM). Variations in the magnetic anisotropy field and the inhomogeneity of were clearly observed in the FMR spectra of microscopic Co thin films 500 and 1000 \u00c5 thick and \u223c40\u00d7200\u2009\u03bcm2 in lateral extent. This demonstrates the important potential that MRFM detection of FMR holds for microscopic characterization of spatial distribution of magnetic properties in magnetic layered materials and devices.</jats:p>",
  "DOI": "10.1063/1.122359",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2002,
        7,
        26
      ]
    ],
    "date-time": "2002-07-26T12:49:10Z",
    "timestamp": 1027687750000
  },
  "page": "2036-2038",
  "update-policy": "http://dx.doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 41,
  "title": "Ferromagnetic resonance force microscopy on microscopic cobalt single layer films",
  "prefix": "10.1063",
  "volume": "73",
  "author": [
    {
      "given": "Z.",
      "family": "Zhang",
      "sequence": "first",
      "affiliation": [
        {
          "name": "Los Alamos National Laboratory, Los Alamos, New Mexico\u200987545"
        }
      ]
    },
    {
      "given": "P. C.",
      "family": "Hammel",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Los Alamos National Laboratory, Los Alamos, New Mexico\u200987545"
        }
      ]
    },
    {
      "given": "M.",
      "family": "Midzor",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "California Institute of Technology, Pasadena, California\u200991125"
        }
      ]
    },
    {
      "given": "M. L.",
      "family": "Roukes",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "California Institute of Technology, Pasadena, California\u200991125"
        }
      ]
    },
    {
      "given": "J. R.",
      "family": "Childress",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "University of Florida, Gainesville, Florida\u200932611"
        }
      ]
    }
  ],
  "member": "317",
  "reference": [
    {
      "key": "2024020315034519800_r1"
    },
    {
      "key": "2024020315034519800_r2"
    },
    {
      "key": "2024020315034519800_r3",
      "doi-asserted-by": "crossref",
      "first-page": "2005",
      "DOI": "10.1063/1.115619",
      "volume": "68",
      "year": "1996",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2024020315034519800_r4",
      "doi-asserted-by": "crossref",
      "first-page": "563",
      "DOI": "10.1038/360563a0",
      "volume": "360",
      "year": "1992",
      "journal-title": "Nature (London)"
    },
    {
      "key": "2024020315034519800_r5",
      "doi-asserted-by": "crossref",
      "first-page": "1560",
      "DOI": "10.1126/science.264.5165.1560",
      "volume": "264",
      "year": "1994",
      "journal-title": "Science"
    },
    {
      "key": "2024020315034519800_r6",
      "doi-asserted-by": "crossref",
      "first-page": "2854",
      "DOI": "10.1063/1.104757",
      "volume": "58",
      "year": "1991",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2024020315034519800_r7",
      "doi-asserted-by": "crossref",
      "first-page": "1124",
      "DOI": "10.1103/PhysRevLett.68.1124",
      "volume": "68",
      "year": "1992",
      "journal-title": "Phys. Rev. Lett."
    },
    {
      "key": "2024020315034519800_r8",
      "doi-asserted-by": "crossref",
      "first-page": "6211",
      "DOI": "10.1063/1.355403",
      "volume": "75",
      "year": "1994",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2024020315034519800_r9",
      "doi-asserted-by": "crossref",
      "first-page": "59",
      "DOI": "10.1007/BF00754562",
      "volume": "101",
      "year": "1995",
      "journal-title": "J. Low Temp. Phys."
    },
    {
      "key": "2024020315034519800_r10",
      "doi-asserted-by": "crossref",
      "first-page": "1754",
      "DOI": "10.1063/1.1142418",
      "volume": "62",
      "year": "1991",
      "journal-title": "Rev. Sci. Instrum."
    },
    {
      "key": "2024020315034519800_r11",
      "doi-asserted-by": "crossref",
      "first-page": "1823",
      "DOI": "10.1063/1.1147967",
      "volume": "68",
      "year": "1997",
      "journal-title": "Rev. Sci. Instrum."
    },
    {
      "key": "2024020315034519800_r12",
      "doi-asserted-by": "crossref",
      "first-page": "2853",
      "DOI": "10.1063/1.1145567",
      "volume": "66",
      "year": "1995",
      "journal-title": "Rev. Sci. Instrum."
    },
    {
      "key": "2024020315034519800_r13"
    }
  ],
  "container-title": "Applied Physics Letters",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/73/14/2036/18536813/2036_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/73/14/2036/18536813/2036_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2024,
        2,
        3
      ]
    ],
    "date-time": "2024-02-03T15:03:57Z",
    "timestamp": 1706972637000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/apl/article/73/14/2036/69083/Ferromagnetic-resonance-force-microscopy-on"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1998,
        10,
        5
      ]
    ]
  },
  "references-count": 13,
  "journal-issue": {
    "issue": "14",
    "published-print": {
      "date-parts": [
        [
          1998,
          10,
          5
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.122359",
  "relation": {},
  "ISSN": [
    "0003-6951",
    "1077-3118"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        1998,
        10,
        5
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        1998,
        10,
        5
      ]
    ]
  }
}