Abstract
A dual-axis atomic force microscope (AFM) cantilever with independent piezoresistive sensors has been developed for simultaneous detection of vertical and lateral forces. The cantilever consists of a flat, triangular probe connected to a base by four tall, narrow ribs. The vertically compliant triangular probe and the laterally compliant ribs incorporate separate piezoresistors for vertical and lateral force sensing. In the fabrication process, a special oblique ion implant technique is used to produce electrical elements on vertical sidewalls and horizontal surfaces of the cantilever structure at the same time. The dual-axis cantilever has been used to perform microfriction measurements as well as obtain simultaneous vertical-force and lateral-force AFM images.
References
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 8:27 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 3, 2024, 9:06 a.m.) |
Indexed | 4 months, 3 weeks ago (April 10, 2025, 1:45 a.m.) |
Issued | 27 years, 5 months ago (March 16, 1998) |
Published | 27 years, 5 months ago (March 16, 1998) |
Published Print | 27 years, 5 months ago (March 16, 1998) |
@article{Chui_1998, title={Independent detection of vertical and lateral forces with a sidewall-implanted dual-axis piezoresistive cantilever}, volume={72}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.121064}, DOI={10.1063/1.121064}, number={11}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Chui, B. W. and Kenny, T. W. and Mamin, H. J. and Terris, B. D. and Rugar, D.}, year={1998}, month=mar, pages={1388–1390} }