DOI: 10.1063/1.120614. Mapping of the magnetic leakage fields from nanoparticles by Fresnel projection microscopy

Mapping of the magnetic leakage fields from nanoparticles by Fresnel projection microscopy

10.1063/1.120614

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

The magnetic leakage fields from the poles of magnetic nanoparticles down to 105–106 spins, isolated or situated at the edges of clusters, are observed with Fresnel projection microscopy by the presence of interference fringes generated by the magnetic phase shifts in the imaging electron beam. The particle shapes and localization of fringes are imaged simultaneously with nanometer spatial resolution at ∼200 V.

Bibliography

Binh, V. T., Purcell, S. T., Semet, V., & Feschet, F. (1998). Mapping of the magnetic leakage fields from nanoparticles by Fresnel projection microscopy. Applied Physics Letters, 72(8), 975â977.

Authors 4

Vu Thien Binh (first)
S. T. Purcell (additional)
V. Semet (additional)
F. Feschet (additional)

References 27 Referenced 13

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Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:07 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 9:01 a.m.)
Indexed	1 year, 6 months ago (Feb. 11, 2024, 4:53 a.m.)
Issued	27 years, 6 months ago (Feb. 23, 1998)
Published	27 years, 6 months ago (Feb. 23, 1998)
Published Print	27 years, 6 months ago (Feb. 23, 1998)

Funders 0

None

BibTeX

@article{Binh_1998, title={Mapping of the magnetic leakage fields from nanoparticles by Fresnel projection microscopy}, volume={72}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.120614}, DOI={10.1063/1.120614}, number={8}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Binh, Vu Thien and Purcell, S. T. and Semet, V. and Feschet, F.}, year={1998}, month=feb, pages={975–977} }

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