DOI: 10.1063/1.120446. Frictional imaging in a scanning near-field optical/atomic-force microscope by a thin step etched optical fiber probe

Frictional imaging in a scanning near-field optical/atomic-force microscope by a thin step etched optical fiber probe

10.1063/1.120446

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

Use of a thin step etched optical fiber probe in a scanning near-field optical/atomic-force microscope (SNOM/AFM) produced frictional imaging. The probe was fabricated by the etching of an optical fiber to decrease its diameter and sharpen the tip end with a HF solution and by irradiating a CO2 laser beam to bend the tip. The spring constant of the thin probe is 100 times smaller than that of a conventional optical fiber probe, which allows the probe to be used as a contact AFM mode and in frictional imaging.

Bibliography

Muramatsu, H., Chiba, N., & Fujihira, M. (1997). Frictional imaging in a scanning near-field optical/atomic-force microscope by a thin step etched optical fiber probe. Applied Physics Letters, 71(15), 2061â2063.

Authors 3

Hiroshi Muramatsu (first)
Norio Chiba (additional)
Masamichi Fujihira (additional)

References 14 Referenced 34

10.1007/BF00332200 / Appl. Phys. A (1994)
10.1063/1.336848 / J. Appl. Phys. (1986)
10.1126/science.257.5067.189 / Science (1992)
10.1063/1.1143212 / Rev. Sci. Instrum. (1992)
10.1063/1.108933 / Appl. Phys. Lett. (1993)
10.1063/1.113395 / Appl. Phys. Lett. (1995)
10.1063/1.111597 / Appl. Phys. Lett. (1994)
{'key': '2024020313214861900_r8'}
10.1016/0304-3991(95)00122-0 / Ultramicroscopy (1995)
{'key': '2024020313214861900_r10'}
10.1016/0304-3991(95)00113-1 / Ultramicroscopy (1995)
10.1063/1.338807 / J. Appl. Phys. (1987)
10.1016/0040-6090(95)06797-3 / Thin Solid Films (1996)
10.1016/0040-6090(92)90561-O / Thin Solid Films (1992)

Dates

Type	When
Created	23 years ago (July 26, 2002, 9:29 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 8:21 a.m.)
Indexed	1 year, 5 months ago (March 14, 2024, 3:20 a.m.)
Issued	27 years, 10 months ago (Oct. 13, 1997)
Published	27 years, 10 months ago (Oct. 13, 1997)
Published Print	27 years, 10 months ago (Oct. 13, 1997)

Funders 0

None

BibTeX

@article{Muramatsu_1997, title={Frictional imaging in a scanning near-field optical/atomic-force microscope by a thin step etched optical fiber probe}, volume={71}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.120446}, DOI={10.1063/1.120446}, number={15}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Muramatsu, Hiroshi and Chiba, Norio and Fujihira, Masamichi}, year={1997}, month=oct, pages={2061–2063} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        3,
        14
      ]
    ],
    "date-time": "2024-03-14T07:20:19Z",
    "timestamp": 1710400819488
  },
  "reference-count": 14,
  "publisher": "AIP Publishing",
  "issue": "15",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        1997,
        10,
        13
      ]
    ]
  },
  "abstract": "<jats:p>Use of a thin step etched optical fiber probe in a scanning near-field optical/atomic-force microscope (SNOM/AFM) produced frictional imaging. The probe was fabricated by the etching of an optical fiber to decrease its diameter and sharpen the tip end with a HF solution and by irradiating a CO2 laser beam to bend the tip. The spring constant of the thin probe is 100 times smaller than that of a conventional optical fiber probe, which allows the probe to be used as a contact AFM mode and in frictional imaging.</jats:p>",
  "DOI": "10.1063/1.120446",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2002,
        7,
        26
      ]
    ],
    "date-time": "2002-07-26T13:29:38Z",
    "timestamp": 1027690178000
  },
  "page": "2061-2063",
  "update-policy": "http://dx.doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 34,
  "title": "Frictional imaging in a scanning near-field optical/atomic-force microscope by a thin step etched optical fiber probe",
  "prefix": "10.1063",
  "volume": "71",
  "author": [
    {
      "given": "Hiroshi",
      "family": "Muramatsu",
      "sequence": "first",
      "affiliation": [
        {
          "name": "Advanced Technology Center, Seiko Instruments Inc., Takatsuka, Matsudo, Chiba 271, Japan"
        }
      ]
    },
    {
      "given": "Norio",
      "family": "Chiba",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Advanced Technology Center, Seiko Instruments Inc., Takatsuka, Matsudo, Chiba 271, Japan"
        }
      ]
    },
    {
      "given": "Masamichi",
      "family": "Fujihira",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Department of Biomolecular Engineering, Tokyo Institute of Technology, Yokohama 226, Japan"
        }
      ]
    }
  ],
  "member": "317",
  "reference": [
    {
      "key": "2024020313214861900_r1",
      "doi-asserted-by": "crossref",
      "first-page": "89",
      "DOI": "10.1007/BF00332200",
      "volume": "59",
      "year": "1994",
      "journal-title": "Appl. Phys. A"
    },
    {
      "key": "2024020313214861900_r2",
      "doi-asserted-by": "crossref",
      "first-page": "3318",
      "DOI": "10.1063/1.336848",
      "volume": "59",
      "year": "1986",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2024020313214861900_r3",
      "doi-asserted-by": "crossref",
      "first-page": "189",
      "DOI": "10.1126/science.257.5067.189",
      "volume": "257",
      "year": "1992",
      "journal-title": "Science"
    },
    {
      "key": "2024020313214861900_r4",
      "doi-asserted-by": "crossref",
      "first-page": "4061",
      "DOI": "10.1063/1.1143212",
      "volume": "63",
      "year": "1992",
      "journal-title": "Rev. Sci. Instrum."
    },
    {
      "key": "2024020313214861900_r5",
      "doi-asserted-by": "crossref",
      "first-page": "461",
      "DOI": "10.1063/1.108933",
      "volume": "62",
      "year": "1993",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2024020313214861900_r6",
      "doi-asserted-by": "crossref",
      "first-page": "3254",
      "DOI": "10.1063/1.113395",
      "volume": "66",
      "year": "1995",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2024020313214861900_r7",
      "doi-asserted-by": "crossref",
      "first-page": "2454",
      "DOI": "10.1063/1.111597",
      "volume": "64",
      "year": "1994",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2024020313214861900_r8"
    },
    {
      "key": "2024020313214861900_r9",
      "doi-asserted-by": "crossref",
      "first-page": "165",
      "DOI": "10.1016/0304-3991(95)00122-0",
      "volume": "61",
      "year": "1995",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "2024020313214861900_r10"
    },
    {
      "key": "2024020313214861900_r11",
      "doi-asserted-by": "crossref",
      "first-page": "265",
      "DOI": "10.1016/0304-3991(95)00113-1",
      "volume": "61",
      "year": "1995",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "2024020313214861900_r12",
      "doi-asserted-by": "crossref",
      "first-page": "4723",
      "DOI": "10.1063/1.338807",
      "volume": "61",
      "year": "1987",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2024020313214861900_r13",
      "doi-asserted-by": "crossref",
      "first-page": "331",
      "DOI": "10.1016/0040-6090(95)06797-3",
      "volume": "273",
      "year": "1996",
      "journal-title": "Thin Solid Films"
    },
    {
      "key": "2024020313214861900_r14",
      "doi-asserted-by": "crossref",
      "first-page": "132",
      "DOI": "10.1016/0040-6090(92)90561-O",
      "volume": "220",
      "year": "1992",
      "journal-title": "Thin Solid Films"
    }
  ],
  "container-title": "Applied Physics Letters",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/71/15/2061/18529625/2061_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/71/15/2061/18529625/2061_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2024,
        2,
        3
      ]
    ],
    "date-time": "2024-02-03T13:21:56Z",
    "timestamp": 1706966516000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/apl/article/71/15/2061/68365/Frictional-imaging-in-a-scanning-near-field"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1997,
        10,
        13
      ]
    ]
  },
  "references-count": 14,
  "journal-issue": {
    "issue": "15",
    "published-print": {
      "date-parts": [
        [
          1997,
          10,
          13
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.120446",
  "relation": {},
  "ISSN": [
    "0003-6951",
    "1077-3118"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        1997,
        10,
        13
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        1997,
        10,
        13
      ]
    ]
  }
}