DOI: 10.1063/1.120427. Material characteristics of perovskite manganese oxide thin films for bolometric applications

Material characteristics of perovskite manganese oxide thin films for bolometric applications

10.1063/1.120427

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

We are optimizing thin films of perovskite manganese oxides for bolometric applications. We have studied the relevant material characteristics of several members of this family namely, La0.7Ba0.3MnO3, La0.7Sr0.3MnO3, La0.7Ca0.3MnO3, and Nd0.7Sr0.3MnO3. Here, we discuss issues related to the choice of material, the influence of deposition parameters, and postdeposition heat treatments on the relevant characteristics such as the resistivity-peak temperature (Tp) and the temperature coefficient of resistance (TCR). For a given material, a higher peak temperature implies a larger temperature coefficient of resistance. In contrast, on comparing different material systems, the TCR tends to decrease as Tp increases.

Bibliography

Goyal, A., Rajeswari, M., Shreekala, R., Lofland, S. E., Bhagat, S. M., Boettcher, T., Kwon, C., Ramesh, R., & Venkatesan, T. (1997). Material characteristics of perovskite manganese oxide thin films for bolometric applications. Applied Physics Letters, 71(17), 2535â2537.

Authors 9

A. Goyal (first)
M. Rajeswari (additional)
R. Shreekala (additional)
S. E. Lofland (additional)
S. M. Bhagat (additional)
T. Boettcher (additional)
C. Kwon (additional)
R. Ramesh (additional)
T. Venkatesan (additional)

References 9 Referenced 210

10.1063/1.110624 / Appl. Phys. Lett. (1993)
10.1103/PhysRevLett.71.2331 / Phys. Rev. Lett. (1993)
10.1126/science.264.5157.413 / Science (1994)
10.1063/1.116635 / Appl. Phys. Lett. (1996)
10.1063/1.113267 / Appl. Phys. Lett. (1995)
10.1103/PhysRevLett.75.914 / Phys. Rev. Lett. (1995)
10.1103/PhysRevB.51.6143 / Phys. Rev. B (1995)
{'key': '2024020313262782800_r8'}
10.1063/1.118104 / Appl. Phys. Lett. (1996)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 8:49 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 8:26 a.m.)
Indexed	3 weeks, 3 days ago (Aug. 6, 2025, 8:24 a.m.)
Issued	27 years, 10 months ago (Oct. 27, 1997)
Published	27 years, 10 months ago (Oct. 27, 1997)
Published Print	27 years, 10 months ago (Oct. 27, 1997)

Funders 0

None

BibTeX

@article{Goyal_1997, title={Material characteristics of perovskite manganese oxide thin films for bolometric applications}, volume={71}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.120427}, DOI={10.1063/1.120427}, number={17}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Goyal, A. and Rajeswari, M. and Shreekala, R. and Lofland, S. E. and Bhagat, S. M. and Boettcher, T. and Kwon, C. and Ramesh, R. and Venkatesan, T.}, year={1997}, month=oct, pages={2535–2537} }

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