Abstract
We report results on the direct observation of the microscopic origins of backswitching in ferroelectric thin films. The piezoelectric response generated in the film by a biased atomic force microscope tip was used to obtain static and dynamic piezoelectric images of individual grains in a polycrystalline material. We demonstrate that polarization reversal occurs under no external field (i.e., loss of remanent polarization) via a dispersive continuous-time random walk process, identified by a stretched exponential decay of the remanent polarization.
References
13
Referenced
198
10.1126/science.246.4936.1400
/ Science (1989){'key': '2024020313413205800_r2'}
10.1063/1.354969
/ J. Appl. Phys. (1993)10.1016/0039-6028(94)91089-8
/ Surf. Sci. Lett. (1994)10.1063/1.117957
/ Appl. Phys. Lett. (1996)10.1063/1.365350
/ J. Appl. Phys. (1997){'key': '2024020313413205800_r7'}
10.1103/PhysRevLett.59.1037
/ Phys. Rev. Lett. (1987){'key': '2024020313413205800_r9', 'first-page': '2455', 'volume': '12', 'year': '1975', 'journal-title': 'Phys. Rev. B'}
/ Phys. Rev. B (1975){'key': '2024020313413205800_r10', 'first-page': '127', 'volume': '9', 'year': '1979', 'journal-title': 'Comments Solid State Phys.'}
/ Comments Solid State Phys. (1979)10.1063/1.1723413
/ J. Appl. Phys. (1958){'key': '2024020313413205800_r12'}
10.1103/PhysRevLett.52.867
/ Phys. Rev. Lett. (1984)
Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:29 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 8:41 a.m.) |
Indexed | 3 days, 19 hours ago (Aug. 27, 2025, 11:57 a.m.) |
Issued | 27 years, 8 months ago (Dec. 15, 1997) |
Published | 27 years, 8 months ago (Dec. 15, 1997) |
Published Print | 27 years, 8 months ago (Dec. 15, 1997) |
@article{Gruverman_1997, title={Nanoscale imaging of domain dynamics and retention in ferroelectric thin films}, volume={71}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.120369}, DOI={10.1063/1.120369}, number={24}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Gruverman, A. and Tokumoto, H. and Prakash, A. S. and Aggarwal, S. and Yang, B. and Wuttig, M. and Ramesh, R. and Auciello, O. and Venkatesan, T.}, year={1997}, month=dec, pages={3492–3494} }