Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

We report results on the direct observation of the microscopic origins of backswitching in ferroelectric thin films. The piezoelectric response generated in the film by a biased atomic force microscope tip was used to obtain static and dynamic piezoelectric images of individual grains in a polycrystalline material. We demonstrate that polarization reversal occurs under no external field (i.e., loss of remanent polarization) via a dispersive continuous-time random walk process, identified by a stretched exponential decay of the remanent polarization.

Bibliography

Gruverman, A., Tokumoto, H., Prakash, A. S., Aggarwal, S., Yang, B., Wuttig, M., Ramesh, R., Auciello, O., & Venkatesan, T. (1997). Nanoscale imaging of domain dynamics and retention in ferroelectric thin films. Applied Physics Letters, 71(24), 3492–3494.

Authors 9
  1. A. Gruverman (first)
  2. H. Tokumoto (additional)
  3. A. S. Prakash (additional)
  4. S. Aggarwal (additional)
  5. B. Yang (additional)
  6. M. Wuttig (additional)
  7. R. Ramesh (additional)
  8. O. Auciello (additional)
  9. T. Venkatesan (additional)
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Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 9:29 a.m.)
Deposited 1 year, 6 months ago (Feb. 3, 2024, 8:41 a.m.)
Indexed 3 days, 19 hours ago (Aug. 27, 2025, 11:57 a.m.)
Issued 27 years, 8 months ago (Dec. 15, 1997)
Published 27 years, 8 months ago (Dec. 15, 1997)
Published Print 27 years, 8 months ago (Dec. 15, 1997)
Funders 0

None

@article{Gruverman_1997, title={Nanoscale imaging of domain dynamics and retention in ferroelectric thin films}, volume={71}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.120369}, DOI={10.1063/1.120369}, number={24}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Gruverman, A. and Tokumoto, H. and Prakash, A. S. and Aggarwal, S. and Yang, B. and Wuttig, M. and Ramesh, R. and Auciello, O. and Venkatesan, T.}, year={1997}, month=dec, pages={3492–3494} }