DOI: 10.1063/1.119497. Off-axis reflection zone plate for quantitative soft x-ray source characterization

Off-axis reflection zone plate for quantitative soft x-ray source characterization

10.1063/1.119497

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

A compact system for high-resolution spectroscopy and quantitative photon flux and brilliance measurements of pulsed soft x-ray sources is described. The calibrated system combines a novel elliptical off-axis reflection zone plate with charge-coupled device detection for simultaneous spectral and spatial measurements. Experiments on a water-window droplet-target laser-plasma source demonstrate λ/Δλ⩾1000 spectral resolution and absolute flux and brilliance measurements. © 1997 American Institute of Physics.

Bibliography

Wilhein, T., Hambach, D., Niemann, B., Berglund, M., Rymell, L., & Hertz, H. M. (1997). Off-axis reflection zone plate for quantitative soft x-ray source characterization. Applied Physics Letters, 71(2), 190â192.

Authors 6

T. Wilhein (first)
D. Hambach (additional)
B. Niemann (additional)
M. Berglund (additional)
L. Rymell (additional)
H. M. Hertz (additional)

References 13 Referenced 45

{'key': '2024020312543787000_r1', 'first-page': '133', 'volume': '3', 'year': '1992', 'journal-title': 'J. X-Ray Sci. Technol.'} / J. X-Ray Sci. Technol. (1992)
{'key': '2024020312543787000_r2'}
{'key': '2024020312543787000_r3'}
{'key': '2024020312543787000_r4'}
10.1063/1.1145258 / Rev. Sci. Instrum. (1995)
{'key': '2024020312543787000_r6'}
{'key': '2024020312543787000_r7', 'article-title': 'X-ray Microbeam Technology and Applications', 'volume-title': 'Proceedings SPIE', 'author': 'Yun', 'year': '1995'} / Proceedings SPIE / X-ray Microbeam Technology and Applications by Yun (1995)
10.1016/0168-9002(95)00407-6 / Nucl. Instrum. Methods Phys. Res. A (1995)
10.1016/0167-9317(95)00192-1 / Microelectron. Eng. (1996)
{'key': '2024020312543787000_r10'}
10.1016/0030-4018(93)90651-K / Opt. Commun. (1993)
10.1063/1.113105 / Appl. Phys. Lett. (1995)
10.1063/1.117027 / Appl. Phys. Lett. (1996)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:29 a.m.)
Deposited	1 year, 7 months ago (Feb. 3, 2024, 7:54 a.m.)
Indexed	1 year, 6 months ago (Feb. 10, 2024, 6:09 a.m.)
Issued	28 years, 1 month ago (July 14, 1997)
Published	28 years, 1 month ago (July 14, 1997)
Published Print	28 years, 1 month ago (July 14, 1997)

Funders 0

None

BibTeX

@article{Wilhein_1997, title={Off-axis reflection zone plate for quantitative soft x-ray source characterization}, volume={71}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.119497}, DOI={10.1063/1.119497}, number={2}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Wilhein, T. and Hambach, D. and Niemann, B. and Berglund, M. and Rymell, L. and Hertz, H. M.}, year={1997}, month=jul, pages={190–192} }

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