DOI: 10.1063/1.119255. Contrast of microwave near-field microscopy

Contrast of microwave near-field microscopy

10.1063/1.119255

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

Constant-height scanning is demonstrated to improve near-field microscopy by eliminating artifacts connected with topography scanning, hence, to image the inherent electromagnetic contrast. Microwaves are chosen for this study because the long wavelength eliminates coherence artifacts, owing to a scale separation of wave and image frequencies. Measured amplitude and phase images of conductive films are quantitatively analyzed by considering the longitudinal electric near field. The observed spatial resolution of 200 nm equals the probing tip size and proves that the skin depth δ of the tip material (here, 1600 nm) presents no resolution limit to scanning optical microscopy.

Bibliography

Knoll, B., Keilmann, F., Kramer, A., & Guckenberger, R. (1997). Contrast of microwave near-field microscopy. Applied Physics Letters, 70(20), 2667â2669.

Authors 4

B. Knoll (first)
F. Keilmann (additional)
A. Kramer (additional)
R. Guckenberger (additional)

References 13 Referenced 109

10.1063/1.94865 / Appl. Phys. Lett. (1984)
10.1063/1.97565 / Appl. Phys. Lett. (1986)
10.1364/JOSAB.2.001538 / J. Opt. Soc. Am. B (1985)
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10.1126/science.269.5227.1083 / Science (1995)
10.1016/0030-4018(96)00108-3 / Opt. Commun. (1996)
{'key': '2024020312413752800_r6'}
10.1016/0304-3991(95)00111-5 / Ultramicroscopy (1995)
{'key': '2024020312413752800_r8'}
10.1126/science.251.5000.1468 / Science (1991)
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Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 8:42 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 7:41 a.m.)
Indexed	1 month ago (July 22, 2025, 7:04 a.m.)
Issued	28 years, 3 months ago (May 19, 1997)
Published	28 years, 3 months ago (May 19, 1997)
Published Print	28 years, 3 months ago (May 19, 1997)

Funders 0

None

BibTeX

@article{Knoll_1997, title={Contrast of microwave near-field microscopy}, volume={70}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.119255}, DOI={10.1063/1.119255}, number={20}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Knoll, B. and Keilmann, F. and Kramer, A. and Guckenberger, R.}, year={1997}, month=may, pages={2667–2669} }

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