DOI: 10.1063/1.118639. Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy

Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy

10.1063/1.118639

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

We present a technique to measure the lateral stiffness of the nanometer-sized contact formed between a friction force microscope tip and a sample surface. Since the lateral stiffness of an elastic contact is proportional to the contact radius, this measurement can be used to study the relationship between friction, load, and contact area. As an example, we measure the lateral stiffness of the contact between a silicon nitride tip and muscovite mica in a humid atmosphere (55% relative humidity) as a function of load. Comparison with friction measurements confirms that friction is proportional to contact area and allows determination of the shear strength.

Bibliography

Carpick, R. W., Ogletree, D. F., & Salmeron, M. (1997). Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy. Applied Physics Letters, 70(12), 1548â1550.

Authors 3

R. W. Carpick (first)
D. F. Ogletree (additional)
M. Salmeron (additional)

References 29 Referenced 372

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{'key': '2024020312252463300_r7'}
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{'key': '2024020312252463300_r12'}
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Dates

Type	When
Created	23 years ago (July 26, 2002, 9:29 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 7:25 a.m.)
Indexed	2 weeks, 1 day ago (Aug. 6, 2025, 9:37 a.m.)
Issued	28 years, 4 months ago (March 24, 1997)
Published	28 years, 4 months ago (March 24, 1997)
Published Print	28 years, 4 months ago (March 24, 1997)

Funders 0

None

BibTeX

@article{Carpick_1997, title={Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy}, volume={70}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.118639}, DOI={10.1063/1.118639}, number={12}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Carpick, R. W. and Ogletree, D. F. and Salmeron, M.}, year={1997}, month=mar, pages={1548–1550} }

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