Abstract
Scanning force microscopy has been used to perform a comparative nanoscale study of domain structures and switching behavior of Pb(ZrxTi1−x)O3 (PZT) thin films integrated into heterostructures with different electrodes. The study revealed a significant difference between polarization state of as-deposited PZT films on RuO2 and Pt electrodes. The PZT/RuO2 films exhibit polydomain crystallites and show almost symmetric switching behavior, while the PZT/Pt films are mainly in a single polarity state and exhibit highly asymmetric piezoelectric hysteresis loops. Formation of unswitchable polarization within the grains of submicron size as a result of fatigue process was directly observed.
References
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Dates
Type | When |
---|---|
Created | 23 years ago (July 26, 2002, 8:42 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 6:47 a.m.) |
Indexed | 3 months ago (May 16, 2025, 3:47 a.m.) |
Issued | 28 years, 9 months ago (Nov. 18, 1996) |
Published | 28 years, 9 months ago (Nov. 18, 1996) |
Published Print | 28 years, 9 months ago (Nov. 18, 1996) |
@article{Gruverman_1996, title={Nanoscale investigation of fatigue effects in Pb(Zr,Ti)O3 films}, volume={69}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.117957}, DOI={10.1063/1.117957}, number={21}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Gruverman, A. and Auciello, O. and Tokumoto, H.}, year={1996}, month=nov, pages={3191–3193} }