Abstract
A novel micromechanical infrared (IR) radiation sensor has been developed using commercially available piezoresistive microcantilevers. Microcantilevers coated with a heat absorbing layer undergo bending due to the differential stress between the top layer (coating) and the substrate. The bending causes a change in the piezoresistance and is proportional to the amount of heat absorbed. The microcantilever IR sensor exhibits two distinct thermal responses: a fast one (<ms) and a slower one (∼10 ms). A noise equivalent power (at a modulation frequency of 30 Hz) was estimated to be ∼70 nW/Hz1/2. This value can be further reduced by designing microcantilevers with better thermal isolation that can allow microcantilevers to be used as uncooled IR radiation detectors.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:07 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 6:44 a.m.) |
Indexed | 5 months, 1 week ago (March 22, 2025, 4:31 a.m.) |
Issued | 28 years, 9 months ago (Nov. 11, 1996) |
Published | 28 years, 9 months ago (Nov. 11, 1996) |
Published Print | 28 years, 9 months ago (Nov. 11, 1996) |
@article{Datskos_1996, title={Remote infrared radiation detection using piezoresistive microcantilevers}, volume={69}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.117752}, DOI={10.1063/1.117752}, number={20}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Datskos, P. G. and Oden, P. I. and Thundat, T. and Wachter, E. A. and Warmack, R. J. and Hunter, S. R.}, year={1996}, month=nov, pages={2986–2988} }