Abstract
We present experimental results and numerical calculations on the detection of picosecond electrical transients by a photoconductively gated scanning tunneling microscope. We show that the transient signal detected in the tunneling regime is coupled by the 5 fF geometric capacitance between tip and sample leading to a correlation current that is linearly proportional to the tunnel conductance.
References
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 8:31 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 3, 2024, 6:36 a.m.) |
Indexed | 4 months, 2 weeks ago (April 17, 2025, 9:06 a.m.) |
Issued | 28 years, 10 months ago (Oct. 7, 1996) |
Published | 28 years, 10 months ago (Oct. 7, 1996) |
Published Print | 28 years, 10 months ago (Oct. 7, 1996) |
@article{Groeneveld_1996, title={The capacitive origin of the picosecond electrical transients detected by a photoconductively gated scanning tunneling microscope}, volume={69}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.117538}, DOI={10.1063/1.117538}, number={15}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Groeneveld, R. H. M. and van Kempen, H.}, year={1996}, month=oct, pages={2294–2296} }