Abstract
The probe-surface interaction underlying the ‘‘shear-force’’ distance control commonly used in near-field microscopy has been studied in detail by measuring dither resonance profiles and approach curves in vacuum and liquid helium. Simulations based on a nonlinear oscillator model considering the probe geometry, its elastic properties, adiabatic short-range probe-surface contact, and the surface tilt angle, are in excellent agreement with the experiments. We prove conclusively that a nonlinear bending force mechanism with parametric mode conversion is responsible for the observed phenomena.
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Dates
Type | When |
---|---|
Created | 23 years ago (July 26, 2002, 9:40 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 5:14 a.m.) |
Indexed | 1 year, 2 months ago (June 3, 2024, 7:14 p.m.) |
Issued | 29 years, 7 months ago (Jan. 15, 1996) |
Published | 29 years, 7 months ago (Jan. 15, 1996) |
Published Print | 29 years, 7 months ago (Jan. 15, 1996) |
@article{Gregor_1996, title={Probe-surface interaction in near-field optical microscopy: The nonlinear bending force mechanism}, volume={68}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.116068}, DOI={10.1063/1.116068}, number={3}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Gregor, M. J. and Blome, P. G. and Schöfer, J. and Ulbrich, R. G.}, year={1996}, month=jan, pages={307–309} }