Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

Large exchange bias effects (ΔE∼1.1 erg/cm2) were observed in antiferromagnetic (FeF2)–ferromagnetic (Fe) bilayers grown on MgO. The FeF2 grows along the spin-compensated (110) direction. The FeF2–Fe interface roughness was characterized using specular and diffuse x-ray diffraction and atomic force microscopy. The magnitude of the exchange bias field HE increases as the interface roughness decreases. These results imply that magnetic domain creation in the antiferromagnet plays an important role.

Bibliography

Nogués, J., Lederman, D., Moran, T. J., Schuller, I. K., & Rao, K. V. (1996). Large exchange bias and its connection to interface structure in FeF2–Fe bilayers. Applied Physics Letters, 68(22), 3186–3188.

Authors 5
  1. J. Nogués (first)
  2. D. Lederman (additional)
  3. T. J. Moran (additional)
  4. Ivan K. Schuller (additional)
  5. K. V. Rao (additional)
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Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 9:40 a.m.)
Deposited 1 year, 6 months ago (Feb. 3, 2024, 5:54 a.m.)
Indexed 3 months, 4 weeks ago (May 3, 2025, 1:42 p.m.)
Issued 29 years, 3 months ago (May 27, 1996)
Published 29 years, 3 months ago (May 27, 1996)
Published Print 29 years, 3 months ago (May 27, 1996)
Funders 0

None

@article{Nogu_s_1996, title={Large exchange bias and its connection to interface structure in FeF2–Fe bilayers}, volume={68}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.115819}, DOI={10.1063/1.115819}, number={22}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Nogués, J. and Lederman, D. and Moran, T. J. and Schuller, Ivan K. and Rao, K. V.}, year={1996}, month=may, pages={3186–3188} }