Abstract
Large exchange bias effects (ΔE∼1.1 erg/cm2) were observed in antiferromagnetic (FeF2)–ferromagnetic (Fe) bilayers grown on MgO. The FeF2 grows along the spin-compensated (110) direction. The FeF2–Fe interface roughness was characterized using specular and diffuse x-ray diffraction and atomic force microscopy. The magnitude of the exchange bias field HE increases as the interface roughness decreases. These results imply that magnetic domain creation in the antiferromagnet plays an important role.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:40 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 5:54 a.m.) |
Indexed | 3 months, 4 weeks ago (May 3, 2025, 1:42 p.m.) |
Issued | 29 years, 3 months ago (May 27, 1996) |
Published | 29 years, 3 months ago (May 27, 1996) |
Published Print | 29 years, 3 months ago (May 27, 1996) |
@article{Nogu_s_1996, title={Large exchange bias and its connection to interface structure in FeF2–Fe bilayers}, volume={68}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.115819}, DOI={10.1063/1.115819}, number={22}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Nogués, J. and Lederman, D. and Moran, T. J. and Schuller, Ivan K. and Rao, K. V.}, year={1996}, month=may, pages={3186–3188} }