DOI: 10.1063/1.115773. Scanning tip microwave near-field microscope

Scanning tip microwave near-field microscope

10.1063/1.115773

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

A near-field microscope which operates in the rf/microwave frequency range is described. In this microscope, a scanning tunneling microscope (STM)-like tip rather than an aperture is used as a point-like evanescent field emitter. A spatial resolution of ∼5 μm (∼λ/100 000) is achieved in the current version. The design of the microscope as well as the principal factors which affect its performance are discussed.

Bibliography

Wei, T., Xiang, X.-D., Wallace-Freedman, W. G., & Schultz, P. G. (1996). Scanning tip microwave near-field microscope. Applied Physics Letters, 68(24), 3506â3508.

Authors 4

T. Wei (first)
X.-D. Xiang (additional)
W. G. Wallace-Freedman (additional)
P. G. Schultz (additional)

References 12 Referenced 168

{'key': '2024020310572118500_r1', 'first-page': '1738', 'article-title': 'Science', 'volume': '268', 'year': '1995'} / Science (1995)
{'key': '2024020310572118500_r2', 'first-page': '273', 'article-title': 'Science', 'volume': '270', 'year': '1995'} / Science (1995)
{'key': '2024020310572118500_r3'}
{'key': '2024020310572118500_r4', 'first-page': '1276', 'article-title': 'J. Appl. Phys.', 'volume': '33', 'year': '1962'} / J. Appl. Phys. (1962)
{'key': '2024020310572118500_r5'}
{'key': '2024020310572118500_r6'}
{'key': '2024020310572118500_r7', 'first-page': '651', 'article-title': 'Appl. Phys. Lett.', 'volume': '44', 'year': '1984'} / Appl. Phys. Lett. (1984)
{'key': '2024020310572118500_r8', 'first-page': '227', 'article-title': 'Ultramicroscopy', 'volume': '13', 'year': '1984'} / Ultramicroscopy (1984)
{'key': '2024020310572118500_r9', 'first-page': '99', 'article-title': 'Appl. Phys. Lett.', 'volume': '66', 'year': '1995'} / Appl. Phys. Lett. (1995)
{'key': '2024020310572118500_r10', 'first-page': '1468', 'article-title': 'Science', 'volume': '251', 'year': '1991'} / Science (1991)
{'key': '2024020310572118500_r11', 'first-page': '1623', 'article-title': 'Appl. Phys. Lett.', 'volume': '65', 'year': '1994'} / Appl. Phys. Lett. (1994)
{'key': '2024020310572118500_r12', 'first-page': '3035', 'article-title': 'Rev. Sci. Instrum.', 'volume': '60', 'year': '1989'} / Rev. Sci. Instrum. (1989)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:40 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 5:57 a.m.)
Indexed	1 week, 4 days ago (Aug. 20, 2025, 9:11 a.m.)
Issued	29 years, 2 months ago (June 10, 1996)
Published	29 years, 2 months ago (June 10, 1996)
Published Print	29 years, 2 months ago (June 10, 1996)

Funders 0

None

BibTeX

@article{Wei_1996, title={Scanning tip microwave near-field microscope}, volume={68}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.115773}, DOI={10.1063/1.115773}, number={24}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Wei, T. and Xiang, X.-D. and Wallace-Freedman, W. G. and Schultz, P. G.}, year={1996}, month=jun, pages={3506–3508} }

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