Abstract
The application of a compact high-efficiency retarding-potential Mott polarimeter in scanning electron microscopy with polarization analysis (SEMPA) is described. Such polarimeters, which combine high-efficiency with large electron optical acceptance and stable long-term operation, are shown to be particularly attractive for use in SEMPA.
References
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 8:04 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 7, 2024, 10:40 a.m.) |
Indexed | 1 year, 6 months ago (Feb. 7, 2024, 11:10 a.m.) |
Issued | 26 years, 7 months ago (Jan. 1, 1999) |
Published | 26 years, 7 months ago (Jan. 1, 1999) |
Published Print | 26 years, 7 months ago (Jan. 1, 1999) |
@article{Barnes_1999, title={Implementation of scanning electron microscopy with polarization analysis using high-efficiency retarding-potential Mott polarimeters}, volume={70}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1149512}, DOI={10.1063/1.1149512}, number={1}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Barnes, J. and Mei, L. and Lairson, B. M. and Dunning, F. B.}, year={1999}, month=jan, pages={246–247} }