DOI: 10.1063/1.114867. Nanometer-scale imaging of potential profiles in optically excited n-i-p-i heterostructure using Kelvin probe force microscopy

Nanometer-scale imaging of potential profiles in optically excited n-i-p-i heterostructure using Kelvin probe force microscopy

10.1063/1.114867

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

We report on measurements of the potential profile of a GaAs/AlGaAs n-i-p-i multiple quantum well structure using a scanning Kelvin probe force microscope (KFM). Using this novel technique we directly measure with meV precision and sub-100 nm spatial resolution the potential difference between n-i-p-i layers with and without external optical excitation. The measured potential profiles, which have not been directly imaged previously, agree well with potential profiles calculated for optically excited n-i-p-i structures, but modified by band bending effects at the surface.

Bibliography

Chavez-Pirson, A., Vatel, O., Tanimoto, M., Ando, H., Iwamura, H., & Kanbe, H. (1995). Nanometer-scale imaging of potential profiles in optically excited n-i-p-i heterostructure using Kelvin probe force microscopy. Applied Physics Letters, 67(21), 3069â3071.

Authors 6

A. Chavez-Pirson (first)
O. Vatel (additional)
M. Tanimoto (additional)
H. Ando (additional)
H. Iwamura (additional)
H. Kanbe (additional)

References 10 Referenced 49

{'key': '2024020309562624800_r1', 'first-page': '2135', 'article-title': 'IEEE J. Quantum Electron.', 'volume': 'QE-25', 'year': '1989'} / IEEE J. Quantum Electron. (1989)
{'key': '2024020309562624800_r2'}
{'key': '2024020309562624800_r3', 'first-page': '1103', 'article-title': 'Appl. Phys. Lett.', 'volume': '52', 'year': '1988'} / Appl. Phys. Lett. (1988)
{'key': '2024020309562624800_r4', 'first-page': '1559', 'article-title': 'J. Vac. Sci. Technol. B', 'volume': '9', 'year': '1991'} / J. Vac. Sci. Technol. B (1991)
{'key': '2024020309562624800_r5', 'first-page': '2921', 'article-title': 'Appl. Phys. Lett.', 'volume': '58', 'year': '1991'} / Appl. Phys. Lett. (1991)
{'key': '2024020309562624800_r6', 'first-page': '3082', 'article-title': 'Ultramicroscopy', 'volume': '42–44', 'year': '1993'} / Ultramicroscopy (1993)
{'key': '2024020309562624800_r7', 'first-page': '2358', 'article-title': 'J. Appl. Phys.', 'volume': '77', 'year': '1995'} / J. Appl. Phys. (1995)
{'key': '2024020309562624800_r8'}
{'key': '2024020309562624800_r9'}
{'key': '2024020309562624800_r10'}

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:40 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 4:56 a.m.)
Indexed	1 month, 4 weeks ago (June 30, 2025, 5:21 p.m.)
Issued	29 years, 9 months ago (Nov. 20, 1995)
Published	29 years, 9 months ago (Nov. 20, 1995)
Published Print	29 years, 9 months ago (Nov. 20, 1995)

Funders 0

None

BibTeX

@article{Chavez_Pirson_1995, title={Nanometer-scale imaging of potential profiles in optically excited n-i-p-i heterostructure using Kelvin probe force microscopy}, volume={67}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.114867}, DOI={10.1063/1.114867}, number={21}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Chavez-Pirson, A. and Vatel, O. and Tanimoto, M. and Ando, H. and Iwamura, H. and Kanbe, H.}, year={1995}, month=nov, pages={3069–3071} }

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