DOI: 10.1063/1.1148168. Pulsed photoelectron microscope for imaging laser-induced nanosecond processes

Pulsed photoelectron microscope for imaging laser-induced nanosecond processes

10.1063/1.1148168

Crossref journal-article

AIP Publishing

Review of Scientific Instruments (317)

Abstract

A flash photoelectron microscope, driven by 4 ns KrF excimer laser pulses, is introduced. The microscope is equipped with a solid state laser for in situ processing of metals with focused nanosecond pulses. Transient stages during laser-induced melting, solidification, and alloying of Al films on bulk substrates have been imaged with an exposure time of 4 ns. The photoelectron microscope is proved to be a powerful real-time probe for fast-proceeding incipient laser-induced damage, sensing changes of surfaces being too shallow to be detected by light interference and electron scanning microscopy. The combined time/space resolution is limited by lens aberrations, space charge, shot noise, and detector efficiency to about 4 ns/1.3 μm, at present.

Bibliography

Bostanjoglo, O., & WeingÃ¤rtner, M. (1997). Pulsed photoelectron microscope for imaging laser-induced nanosecond processes. Review of Scientific Instruments, 68(6), 2456â2460.

Authors 2

O. Bostanjoglo (first)
M. Weingärtner (additional)

References 15 Referenced 24

{'key': '2023070816373764200_r1'}
{'key': '2023070816373764200_r2', 'first-page': '1639', 'volume': '61', 'year': '1990', 'journal-title': 'Rev. Sci. Instrum.'} / Rev. Sci. Instrum. (1990)
10.1063/1.342586 / J. Appl. Phys. (1989)
10.1016/0169-4332(92)90053-Z / Appl. Surf. Sci. (1992)
10.1063/1.356542 / J. Appl. Phys. (1994)
10.1016/S0065-2539(08)60836-7 / Adv. Electron. Electron Phys. (1963)
{'key': '2023070816373764200_r7'}
10.1016/0304-3991(91)90136-T / Ultramicroscopy (1991)
10.1016/0304-3991(91)90146-W / Ultramicroscopy (1991)
10.1016/0304-3991(91)90155-Y / Ultramicroscopy (1991)
10.1016/0304-3991(93)90238-S / Ultramicroscopy (1993)
10.1007/BF00555046 / J. Mater. Sci. (1969)
10.1016/0304-3991(91)90154-X / Ultramicroscopy (1991)
10.1063/1.329216 / J. Appl. Phys. (1981)
{'key': '2023070816373764200_r15', 'first-page': '873', 'volume': 'QE-19', 'year': '1983', 'journal-title': 'IEEE J. Quantum Electron.'} / IEEE J. Quantum Electron. (1983)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 8:34 a.m.)
Deposited	2 years, 1 month ago (July 8, 2023, 12:37 p.m.)
Indexed	1 year, 6 months ago (Feb. 10, 2024, 10:21 p.m.)
Issued	28 years, 3 months ago (June 1, 1997)
Published	28 years, 3 months ago (June 1, 1997)
Published Print	28 years, 3 months ago (June 1, 1997)

Funders 0

None

BibTeX

@article{Bostanjoglo_1997, title={Pulsed photoelectron microscope for imaging laser-induced nanosecond processes}, volume={68}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1148168}, DOI={10.1063/1.1148168}, number={6}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Bostanjoglo, O. and Weingärtner, M.}, year={1997}, month=jun, pages={2456–2460} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        2,
        11
      ]
    ],
    "date-time": "2024-02-11T03:21:46Z",
    "timestamp": 1707621706502
  },
  "reference-count": 15,
  "publisher": "AIP Publishing",
  "issue": "6",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        1997,
        6,
        1
      ]
    ]
  },
  "abstract": "<jats:p>A flash photoelectron microscope, driven by 4 ns KrF excimer laser pulses, is introduced. The microscope is equipped with a solid state laser for in situ processing of metals with focused nanosecond pulses. Transient stages during laser-induced melting, solidification, and alloying of Al films on bulk substrates have been imaged with an exposure time of 4 ns. The photoelectron microscope is proved to be a powerful real-time probe for fast-proceeding incipient laser-induced damage, sensing changes of surfaces being too shallow to be detected by light interference and electron scanning microscopy. The combined time/space resolution is limited by lens aberrations, space charge, shot noise, and detector efficiency to about 4 ns/1.3 \u03bcm, at present.</jats:p>",
  "DOI": "10.1063/1.1148168",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2002,
        7,
        26
      ]
    ],
    "date-time": "2002-07-26T12:34:33Z",
    "timestamp": 1027686873000
  },
  "page": "2456-2460",
  "update-policy": "http://dx.doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 24,
  "title": "Pulsed photoelectron microscope for imaging laser-induced nanosecond processes",
  "prefix": "10.1063",
  "volume": "68",
  "author": [
    {
      "given": "O.",
      "family": "Bostanjoglo",
      "sequence": "first",
      "affiliation": [
        {
          "name": "Optisches Institut der Technischen Universit\u00e4t Berlin, Strasse des 17. Juni 135, 10623 Berlin, Germany"
        }
      ]
    },
    {
      "given": "M.",
      "family": "Weing\u00e4rtner",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Optisches Institut der Technischen Universit\u00e4t Berlin, Strasse des 17. Juni 135, 10623 Berlin, Germany"
        }
      ]
    }
  ],
  "member": "317",
  "reference": [
    {
      "key": "2023070816373764200_r1"
    },
    {
      "key": "2023070816373764200_r2",
      "first-page": "1639",
      "volume": "61",
      "year": "1990",
      "journal-title": "Rev. Sci. Instrum."
    },
    {
      "key": "2023070816373764200_r3",
      "doi-asserted-by": "crossref",
      "first-page": "129",
      "DOI": "10.1063/1.342586",
      "volume": "65",
      "year": "1989",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2023070816373764200_r4",
      "doi-asserted-by": "crossref",
      "first-page": "255",
      "DOI": "10.1016/0169-4332(92)90053-Z",
      "volume": "54",
      "year": "1992",
      "journal-title": "Appl. Surf. Sci."
    },
    {
      "key": "2023070816373764200_r5",
      "doi-asserted-by": "crossref",
      "first-page": "8027",
      "DOI": "10.1063/1.356542",
      "volume": "75",
      "year": "1994",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2023070816373764200_r6",
      "doi-asserted-by": "crossref",
      "first-page": "251",
      "DOI": "10.1016/S0065-2539(08)60836-7",
      "volume": "18",
      "year": "1963",
      "journal-title": "Adv. Electron. Electron Phys."
    },
    {
      "key": "2023070816373764200_r7"
    },
    {
      "key": "2023070816373764200_r8",
      "doi-asserted-by": "crossref",
      "first-page": "29",
      "DOI": "10.1016/0304-3991(91)90136-T",
      "volume": "36",
      "year": "1991",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "2023070816373764200_r9",
      "doi-asserted-by": "crossref",
      "first-page": "148",
      "DOI": "10.1016/0304-3991(91)90146-W",
      "volume": "36",
      "year": "1991",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "2023070816373764200_r10",
      "doi-asserted-by": "crossref",
      "first-page": "262",
      "DOI": "10.1016/0304-3991(91)90155-Y",
      "volume": "36",
      "year": "1991",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "2023070816373764200_r11",
      "doi-asserted-by": "crossref",
      "first-page": "318",
      "DOI": "10.1016/0304-3991(93)90238-S",
      "volume": "49",
      "year": "1993",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "2023070816373764200_r12",
      "doi-asserted-by": "crossref",
      "first-page": "39",
      "DOI": "10.1007/BF00555046",
      "volume": "4",
      "year": "1969",
      "journal-title": "J. Mater. Sci."
    },
    {
      "key": "2023070816373764200_r13",
      "doi-asserted-by": "crossref",
      "first-page": "252",
      "DOI": "10.1016/0304-3991(91)90154-X",
      "volume": "36",
      "year": "1991",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "2023070816373764200_r14",
      "doi-asserted-by": "crossref",
      "first-page": "3780",
      "DOI": "10.1063/1.329216",
      "volume": "52",
      "year": "1981",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2023070816373764200_r15",
      "first-page": "873",
      "volume": "QE-19",
      "year": "1983",
      "journal-title": "IEEE J. Quantum Electron."
    }
  ],
  "container-title": "Review of Scientific Instruments",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/rsi/article-pdf/68/6/2456/11022895/2456_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/rsi/article-pdf/68/6/2456/11022895/2456_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2023,
        7,
        8
      ]
    ],
    "date-time": "2023-07-08T16:37:44Z",
    "timestamp": 1688834264000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/rsi/article/68/6/2456/450061/Pulsed-photoelectron-microscope-for-imaging-laser"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1997,
        6,
        1
      ]
    ]
  },
  "references-count": 15,
  "journal-issue": {
    "issue": "6",
    "published-print": {
      "date-parts": [
        [
          1997,
          6,
          1
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.1148168",
  "relation": {},
  "ISSN": [
    "0034-6748",
    "1089-7623"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        1997,
        6
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        1997,
        6,
        1
      ]
    ]
  }
}