Abstract
Electron spin resonance (ESR) of phosphorus-doped silicon was detected using a low temperature magnetic resonance force microscope (MRFM). Force-detected ESR spectra were obtained using an amplitude or frequency modulated microwave field to cyclically saturate the spin magnetization. For a sample containing 4×1018 phosphorus atoms/cm3, a single strong ESR line was observed. For a sample containing 8×1016 phosphorus atoms/cm3, a pair of lines split by the 42 G P31 hyperfine interaction was observed. This result demonstrates the possibility of using MRFM techniques for spectroscopic purposes.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:50 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 5, 2024, 8:51 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 11, 2024, 2:58 a.m.) |
Issued | 28 years, 5 months ago (April 1, 1997) |
Published | 28 years, 5 months ago (April 1, 1997) |
Published Print | 28 years, 5 months ago (April 1, 1997) |
@article{Wago_1997, title={Magnetic resonance force detection and spectroscopy of electron spins in phosphorus-doped silicon}, volume={68}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1147967}, DOI={10.1063/1.1147967}, number={4}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Wago, K. and Züger, O. and Wegener, J. and Kendrick, R. and Yannoni, C. S. and Rugar, D.}, year={1997}, month=apr, pages={1823–1826} }