Crossref journal-article
AIP Publishing
Review of Scientific Instruments (317)
Abstract

Electron spin resonance (ESR) of phosphorus-doped silicon was detected using a low temperature magnetic resonance force microscope (MRFM). Force-detected ESR spectra were obtained using an amplitude or frequency modulated microwave field to cyclically saturate the spin magnetization. For a sample containing 4×1018 phosphorus atoms/cm3, a single strong ESR line was observed. For a sample containing 8×1016 phosphorus atoms/cm3, a pair of lines split by the 42 G P31 hyperfine interaction was observed. This result demonstrates the possibility of using MRFM techniques for spectroscopic purposes.

Bibliography

Wago, K., Züger, O., Wegener, J., Kendrick, R., Yannoni, C. S., & Rugar, D. (1997). Magnetic resonance force detection and spectroscopy of electron spins in phosphorus-doped silicon. Review of Scientific Instruments, 68(4), 1823–1826.

Authors 6
  1. K. Wago (first)
  2. O. Züger (additional)
  3. J. Wegener (additional)
  4. R. Kendrick (additional)
  5. C. S. Yannoni (additional)
  6. D. Rugar (additional)
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Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 9:50 a.m.)
Deposited 1 year, 6 months ago (Feb. 5, 2024, 8:51 p.m.)
Indexed 1 year, 6 months ago (Feb. 11, 2024, 2:58 a.m.)
Issued 28 years, 5 months ago (April 1, 1997)
Published 28 years, 5 months ago (April 1, 1997)
Published Print 28 years, 5 months ago (April 1, 1997)
Funders 0

None

@article{Wago_1997, title={Magnetic resonance force detection and spectroscopy of electron spins in phosphorus-doped silicon}, volume={68}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1147967}, DOI={10.1063/1.1147967}, number={4}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Wago, K. and Züger, O. and Wegener, J. and Kendrick, R. and Yannoni, C. S. and Rugar, D.}, year={1997}, month=apr, pages={1823–1826} }