DOI: 10.1063/1.1145642. Spectrometer for high resolution resonant inelastic x-ray scatteringa)

Spectrometer for high resolution resonant inelastic x-ray scatteringa)

10.1063/1.1145642

Crossref journal-article

AIP Publishing

Review of Scientific Instruments (317)

Abstract

The requirements on the radiation source, the monochromator/mirror, the diffractometer, and the crystal dispersive analyzer for an optimum instrumentation dedicated to high resolution resonant inelastic scattering experiments are formulated. The possibility for the application of dispersion compensation is stressed. A provisional instrumentation at the HARWI–Compton beamline is described and test measurements of the resonant inelastic scattering cross section of Cu for incident photon energies scanning across the K threshold and for scattered photon energies near the Kα1 line are reported. By means of model calculation the important role of correct absorption correction of resonant inelastic scattering data is emphasized.

Bibliography

SchÃ¼lke, W., Kaprolat, A., Fischer, Th., HÃ¶ppner, K., & Wohlert, F. (1995). Spectrometer for high resolution resonant inelastic x-ray scatteringa). Review of Scientific Instruments, 66(3), 2446â2452.

Authors 5

W. Schülke (first)
A. Kaprolat (additional)
Th. Fischer (additional)
K. Höppner (additional)
F. Wohlert (additional)

References 9 Referenced 10

{'key': '2024021017294313300_r1'}
10.1103/PhysRevLett.69.2598 / Phys. Rev. Lett. (1992)
10.1103/PhysRevLett.61.1245 / Phys. Rev. Lett. (1988)
10.1103/PhysRevLett.67.2850 / Phys. Rev. Lett. (1991)
10.1016/0167-5087(84)90542-8 / Nucl. Instrum. Methods (1984)
10.1016/0168-9002(92)90631-D / Nucl. Instrum. Methods A (1992)
{'key': '2024021017294313300_r7'}
10.1002/pssa.2211240224 / Phys. Status Solidi A (1991)
10.1088/0022-3700/13/17/013 / J. Phys. B: At. Mol. Phys. (1980)

Dates

Type	When
Created	23 years ago (July 26, 2002, 8:03 a.m.)
Deposited	1 year, 6 months ago (Feb. 10, 2024, 1:07 p.m.)
Indexed	1 year, 6 months ago (Feb. 10, 2024, 1:40 p.m.)
Issued	30 years, 5 months ago (March 1, 1995)
Published	30 years, 5 months ago (March 1, 1995)
Published Print	30 years, 5 months ago (March 1, 1995)

Funders 0

None

BibTeX

@article{Sch_lke_1995, title={Spectrometer for high resolution resonant inelastic x-ray scatteringa)}, volume={66}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1145642}, DOI={10.1063/1.1145642}, number={3}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Schülke, W. and Kaprolat, A. and Fischer, Th. and Höppner, K. and Wohlert, F.}, year={1995}, month=mar, pages={2446–2452} }

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