DOI: 10.1063/1.1145289. Design and performance of a high-temperature, high-speed scanning tunneling microscope

Design and performance of a high-temperature, high-speed scanning tunneling microscope

10.1063/1.1145289

Crossref journal-article

AIP Publishing

Review of Scientific Instruments (317)

Abstract

This article describes the design and performance of a new scanning tunneling microscope (STM) which operates at elevated temperatures and high scanning speeds. To minimize the thermal displacements within the STM, a symmetric configuration was chosen with a large temperature gradient between the sample and the piezoelectric scanner. The thermal behavior of the STM was optimized further by means of a finite element analysis. The high scan rates (105 data points/s) are accomplished with fast analogue electronics and a combination of a workstation and three transputers. The STM has imaged surfaces with atomic resolution between room temperature and 750 K, with low residual drifts only two hours after a major temperature change. The sample surface remains within the vertical range of the piezo actuator over a temperature interval of 159 K.

Authors 7

L. Kuipers (first)
R. W. M. Loos (additional)
H. Neerings (additional)
J. ter Horst (additional)
G. J. Ruwiel (additional)
A. P. de Jongh (additional)
J. W. M. Frenken (additional)

References 27 Referenced 53

{'key': '2024020614181715200_r1'}
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10.1016/0039-6028(92)91448-K / Surf. Sci. (1992)
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{'key': '2024020614181715200_r11'}
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Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 8:39 a.m.)
Deposited	1 year, 6 months ago (Feb. 6, 2024, 9:40 a.m.)
Indexed	1 year, 2 months ago (June 12, 2024, 8:59 p.m.)
Issued	30 years ago (Sept. 1, 1995)
Published	30 years ago (Sept. 1, 1995)
Published Print	30 years ago (Sept. 1, 1995)

Funders 0

None

BibTeX

@article{Kuipers_1995, title={Design and performance of a high-temperature, high-speed scanning tunneling microscope}, volume={66}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1145289}, DOI={10.1063/1.1145289}, number={9}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Kuipers, L. and Loos, R. W. M. and Neerings, H. and ter Horst, J. and Ruwiel, G. J. and de Jongh, A. P. and Frenken, J. W. M.}, year={1995}, month=sep, pages={4557–4565} }

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