DOI: 10.1063/1.1144610. Scanning nearfield optical microscope using microfabricated probes

Scanning nearfield optical microscope using microfabricated probes

10.1063/1.1144610

Crossref journal-article

AIP Publishing

Review of Scientific Instruments (317)

Abstract

Microfabricated tips, usually used for atomic force microscopy (AFM), can be modified and used in a scanning nearfield optical microscope. Initial images show a resolution of about 80 nm (λ/8) demonstrating the quality and usefulness of these tips. They are mechanically stable, potentially commercially available, and have high light transmissibility. Furthermore, they can be easily combined with an atomic force microscope to give simultaneous nearfield optical and AFM images.

Bibliography

Radmacher, M., Hillner, P. E., & Hansma, P. K. (1994). Scanning nearfield optical microscope using microfabricated probes. Review of Scientific Instruments, 65(8), 2737â2738.

Authors 3

M. Radmacher (first)
P. E. Hillner (additional)
P. K. Hansma (additional)

References 18 Referenced 25

{'key': '2024021017561484300_r1', 'first-page': '727', 'volume': '3', 'year': '1993', 'journal-title': 'J. Phys. II'} / J. Phys. II (1993)
{'key': '2024021017561484300_r2', 'first-page': '721', 'volume': '365', 'year': '1993', 'journal-title': 'Science'} / Science (1993)
{'key': '2024021017561484300_r3'}
10.1080/14786440808564615 / Philos. Mag. (1928)
10.1038/237510a0 / Nature (1972)
10.1063/1.94865 / Appl. Phys. Lett. (1984)
{'key': '2024021017561484300_r7', 'first-page': '510', 'volume': '9', 'year': '1990', 'journal-title': 'J. Vac. Sci Technol. B'} / J. Vac. Sci Technol. B (1990)
10.1126/science.257.5067.189 / Science (1992)
10.1063/1.106940 / Appl. Phys. Lett. (1992)
10.1126/science.257.5067.189 / Science (1992)
{'key': '2024021017561484300_r11'}
10.1063/1.1142244 / Rev. Sci. Instrum. (1991)
10.1103/PhysRevLett.56.930 / Phys. Rev. Lett. (1986)
10.1063/1.103677 / Appl. Phys. Lett. (1990)
{'key': '2024021017561484300_r15', 'first-page': '319', 'volume': '33', 'year': '1988', 'journal-title': 'Bull. Am. Phys. Soc.'} / Bull. Am. Phys. Soc. (1988)
10.1063/1.342563 / J. Appl. Phys. (1989)
{'key': '2024021017561484300_r17'}
10.1111/j.1365-2818.1993.tb03363.x / Microscopy (1993)

Dates

Type	When
Created	23 years ago (July 26, 2002, 9:58 a.m.)
Deposited	1 year, 6 months ago (Feb. 10, 2024, 1:21 p.m.)
Indexed	1 year, 6 months ago (Feb. 10, 2024, 1:40 p.m.)
Issued	31 years ago (Aug. 1, 1994)
Published	31 years ago (Aug. 1, 1994)
Published Print	31 years ago (Aug. 1, 1994)

Funders 0

None

BibTeX

@article{Radmacher_1994, title={Scanning nearfield optical microscope using microfabricated probes}, volume={65}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1144610}, DOI={10.1063/1.1144610}, number={8}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Radmacher, M. and Hillner, P. E. and Hansma, P. K.}, year={1994}, month=aug, pages={2737–2738} }

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