DOI: 10.1063/1.1144449. Erratum: ‘‘Calibration of atomic-force microscope tips’’ [Rev. Sci. Instrum. <b>64</b>, 1868 (1993)]

Erratum: ‘‘Calibration of atomic-force microscope tips’’ [Rev. Sci. Instrum. 64, 1868 (1993)]

10.1063/1.1144449

Crossref journal-article

AIP Publishing

Review of Scientific Instruments (317)

Bibliography

Hutter, J. L., & Bechhoefer, J. (1993). Erratum: ââCalibration of atomic-force microscope tipsââ [Rev. Sci. Instrum. 64, 1868 (1993)]. Review of Scientific Instruments, 64(11), 3342â3342.

Authors 2

Jeffrey L. Hutter (first)
John Bechhoefer (additional)

References 0 Referenced 99

None

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:58 a.m.)
Deposited	2 years, 1 month ago (July 3, 2023, 4:57 p.m.)
Indexed	2 months, 2 weeks ago (June 13, 2025, 4:06 a.m.)
Issued	31 years, 9 months ago (Nov. 1, 1993)
Published	31 years, 9 months ago (Nov. 1, 1993)
Published Print	31 years, 9 months ago (Nov. 1, 1993)

Funders 0

None

BibTeX

@article{Hutter_1993, title={Erratum: ‘“Calibration of atomic-force microscope tips”’ [Rev. Sci. Instrum. 64, 1868 (1993)]}, volume={64}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1144449}, DOI={10.1063/1.1144449}, number={11}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Hutter, Jeffrey L. and Bechhoefer, John}, year={1993}, month=nov, pages={3342–3342} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        6,
        13
      ]
    ],
    "date-time": "2025-06-13T08:06:08Z",
    "timestamp": 1749801968566,
    "version": "3.30.1"
  },
  "update-to": [
    {
      "updated": {
        "date-parts": [
          [
            1993,
            11,
            1
          ]
        ],
        "date-time": "1993-11-01T00:00:00Z",
        "timestamp": 752112000000
      },
      "DOI": "10.1063/1.1143970",
      "type": "correction",
      "source": "publisher",
      "label": "Correction"
    }
  ],
  "reference-count": 0,
  "publisher": "AIP Publishing",
  "issue": "11",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        1993,
        11,
        1
      ]
    ]
  },
  "DOI": "10.1063/1.1144449",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2002,
        7,
        26
      ]
    ],
    "date-time": "2002-07-26T13:58:11Z",
    "timestamp": 1027691891000
  },
  "page": "3342-3342",
  "update-policy": "https://doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 99,
  "title": "Erratum: \u2018\u2018Calibration of atomic-force microscope tips\u2019\u2019 [Rev. Sci. Instrum. <b>64</b>, 1868 (1993)]",
  "prefix": "10.1063",
  "volume": "64",
  "author": [
    {
      "given": "Jeffrey L.",
      "family": "Hutter",
      "sequence": "first",
      "affiliation": [
        {
          "name": "Department of Physics, Simon Fraser University, Burnaby, British Columbia, V5A 1S6, Canada"
        }
      ]
    },
    {
      "given": "John",
      "family": "Bechhoefer",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Department of Physics, Simon Fraser University, Burnaby, British Columbia, V5A 1S6, Canada"
        }
      ]
    }
  ],
  "member": "317",
  "container-title": "Review of Scientific Instruments",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/rsi/article-pdf/64/11/3342/9914441/3342_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/rsi/article-pdf/64/11/3342/9914441/3342_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2023,
        7,
        3
      ]
    ],
    "date-time": "2023-07-03T20:57:40Z",
    "timestamp": 1688417860000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/rsi/article/64/11/3342/342906/Erratum-Calibration-of-atomic-force-microscope"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1993,
        11,
        1
      ]
    ]
  },
  "references-count": 0,
  "journal-issue": {
    "issue": "11",
    "published-print": {
      "date-parts": [
        [
          1993,
          11,
          1
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.1144449",
  "relation": {},
  "ISSN": [
    "0034-6748",
    "1089-7623"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        1993,
        11
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        1993,
        11,
        1
      ]
    ]
  }
}