Crossref journal-article
AIP Publishing
Review of Scientific Instruments (317)
Abstract

We have developed a 3.6 μm scan range atomic force microscope that scans the cantilever instead of the sample, while the optical-lever detection apparatus remains stationary. The design permits simpler, more adaptable sample mounting, and generally improves ease of use. Software workarounds alleviate the minor effects of spurious signal variations that arise as a result of scanning the cantilever. The performance of the microscope matches that of scanned-sample instruments.

Bibliography

Baselt, D. R., & Baldeschwieler, J. D. (1993). Scanned-cantilever atomic force microscope. Review of Scientific Instruments, 64(4), 908–911.

Authors 2
  1. David R. Baselt (first)
  2. John D. Baldeschwieler (additional)
References 15 Referenced 21
  1. 10.1103/PhysRevLett.56.930 / Phys. Rev. Lett. (1986)
  2. 10.1063/1.100061 / Appl. Phys. Lett. (1988)
  3. 10.1063/1.342563 / J. Appl. Phys. (1989)
  4. 10.1063/1.1143303 / Rev. Sci. Instrum. (1992)
  5. 10.1016/S0039-6028(87)80411-9 / Surf. Sci. (1987)
  6. 10.1116/1.575440 / J. Vac. Sci. Technol. A (1988)
  7. 10.1116/1.576401 / J. Vac. Sci. Technol. A (1990)
  8. {'key': '2024020519050224600_r6'}
  9. {'key': '2024020519050224600_r7'}
  10. {'key': '2024020519050224600_r8'}
  11. {'key': '2024020519050224600_r9'}
  12. {'key': '2024020519050224600_r10'}
  13. {'key': '2024020519050224600_r11'}
  14. {'key': '2024020519050224600_r12'}
  15. 10.1116/1.586061 / J. Vac. Sci. Technol. B (1992)
Dates
Type When
Created 23 years ago (July 26, 2002, 9:58 a.m.)
Deposited 1 year, 6 months ago (Feb. 5, 2024, 3:10 p.m.)
Indexed 1 year, 6 months ago (Feb. 11, 2024, 2:58 a.m.)
Issued 32 years, 4 months ago (April 1, 1993)
Published 32 years, 4 months ago (April 1, 1993)
Published Print 32 years, 4 months ago (April 1, 1993)
Funders 0

None

@article{Baselt_1993, title={Scanned-cantilever atomic force microscope}, volume={64}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1144142}, DOI={10.1063/1.1144142}, number={4}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Baselt, David R. and Baldeschwieler, John D.}, year={1993}, month=apr, pages={908–911} }