Abstract
A design is presented for a scanning tunneling microscope (STM) capable of operation over a temperature range of approximately 80–350 K in ultrahigh vacuum. An integral inchworm-like sample translation device avoids problems with unreliability and lock-up by using clamping elements which have an unusually large range of motion. The entire STM, including the sample and the tip, are held isothermal. Temperature drift is less than 0.1 Å/min. A set temperature may be maintained, within 2°, for over 10 h. Operation of the instrument is demonstrated with an image of the Si(001) surface recorded at 120 K.
References
9
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:57 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 7, 2024, 2:07 p.m.) |
Indexed | 1 year, 2 months ago (June 3, 2024, 5:12 p.m.) |
Issued | 32 years, 11 months ago (Sept. 1, 1992) |
Published | 32 years, 11 months ago (Sept. 1, 1992) |
Published Print | 32 years, 11 months ago (Sept. 1, 1992) |
@article{Wolkow_1992, title={A variable temperature scanning tunneling microscope for use in ultrahigh vacuum}, volume={63}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1143264}, DOI={10.1063/1.1143264}, number={9}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Wolkow, Robert A.}, year={1992}, month=sep, pages={4049–4052} }