DOI: 10.1063/1.1143138. Low-energy electron diffraction with energy resolution

Low-energy electron diffraction with energy resolution

10.1063/1.1143138

Crossref journal-article

AIP Publishing

Review of Scientific Instruments (317)

Abstract

Low-energy electron diffraction (LEED) is a well established technique for evaluation of the surface atom arrangement. The information is derived from the elastically scattered electrons. Usually the thermal diffuse background between diffraction spots is assumed to be constant and subtracted as a constant. For spot profile analysis, which provides the arrangement of units like islands or domains, the elastic intensity has to be measured throughout the Brillouin zone. The usual LEED systems (with energy resolution of some eV) cannot distinguish between elastic and thermal diffuse scattering. For that purpose a new instrument has been developed. We combined the deflection unit from a high-resolution LEED system with 127° analyzer from a high-resolution electron energy loss spectrometer (EELS) in a suitable manner. The new instrument was checked with the Si(111), Al(111), and Al(111)+O2 surface. The energy resolution (ΔE=6.7 meV) allows separation of a large fraction of phonon losses. The momentum resolution (transfer width 150 nm) is the same as other high-resolution LEED systems. As a result the first LEED system with both high momentum and high energy resolution is presented (ELS-LEED).

Bibliography

Claus, H., BÃ¼ssenschÃ¼tt, A., & Henzler, M. (1992). Low-energy electron diffraction with energy resolution. Review of Scientific Instruments, 63(4), 2195â2199.

Authors 3

H. Claus (first)
A. Büssenschütt (additional)
M. Henzler (additional)

References 16 Referenced 62

10.1016/0378-5963(82)90092-7 / Appl. Surf. Sci. (1982)
10.1016/0039-6028(85)90511-4 / Surf. Sci. (1985)
10.1016/0039-6028(86)90722-3 / Surf. Sci. (1986)
{'key': '2024020714303957500_r4', 'first-page': '230', 'volume': '41/42', 'year': '1989', 'journal-title': 'Appl. Surf. Sci.'} / Appl. Surf. Sci. (1989)
10.1016/0039-6028(86)90321-3 / Surf. Sci. (1986)
10.1063/1.1134064 / Rev. Sci. Instrum. (1975)
{'key': '2024020714303957500_r7'}
{'key': '2024020714303957500_r8'}
{'key': '2024020714303957500_r9', 'first-page': '584', 'volume': '2', 'year': '1984', 'journal-title': 'J. Vac. Sci. Technol. B'} / J. Vac. Sci. Technol. B (1984)
10.1103/PhysRevB.30.5968 / Phys. Rev. B (1984)
{'key': '2024020714303957500_r11'}
10.1007/BF00616582 / Appl. Phys. A (1984)
10.1103/PhysRevLett.46.1033 / Phys. Rev. Lett. (1981)
10.1016/0039-6028(86)90663-1 / Surf. Sci. (1986)
{'key': '2024020714303957500_r15'}
10.1103/PhysRevLett.55.2312 / Phys. Rev. Lett. (1985)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:57 a.m.)
Deposited	1 year, 6 months ago (Feb. 7, 2024, 4:07 p.m.)
Indexed	1 year, 2 months ago (June 21, 2024, 2:56 p.m.)
Issued	33 years, 5 months ago (April 1, 1992)
Published	33 years, 5 months ago (April 1, 1992)
Published Print	33 years, 5 months ago (April 1, 1992)

Funders 0

None

BibTeX

@article{Claus_1992, title={Low-energy electron diffraction with energy resolution}, volume={63}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1143138}, DOI={10.1063/1.1143138}, number={4}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Claus, H. and Büssenschütt, A. and Henzler, M.}, year={1992}, month=apr, pages={2195–2199} }

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