DOI: 10.1063/1.1141498. Thermal conductivity measurement from 30 to 750 K: the 3ω method

Thermal conductivity measurement from 30 to 750 K: the 3ω method

10.1063/1.1141498

Crossref journal-article

AIP Publishing

Review of Scientific Instruments (317)

Abstract

An ac technique for measuring the thermal conductivity of dielectric solids between 30 and 750 K is described. This technique, the 3ω method, can be applied to bulk amorphous solids and crystals as well as amorphous films tens of microns thick. Errors from black-body radiation are calculated to be less than 2% even at 1000 K. Data for a-SiO2, Pyrex 7740, and Pyroceram 9606 are compared to results obtained by conventional techniques.

Bibliography

Cahill, D. G. (1990). Thermal conductivity measurement from 30 to 750 K: the 3Ï method. Review of Scientific Instruments, 61(2), 802â808.

Authors 1

David G. Cahill (first)

References 26 Referenced 1,652

{'key': '2023070215550130900_r1'}
{'key': '2023070215550130900_r2', 'first-page': '90', 'volume': '208', 'year': '1951', 'journal-title': 'Proc. R. Soc. (London) A'} / Proc. R. Soc. (London) A (1951)
{'key': '2023070215550130900_r3'}
{'key': '2023070215550130900_r4'}
{'key': '2023070215550130900_r5'}
10.1103/PhysRevB.35.4067 / Phys. Rev. B (1987)
10.1103/PhysRevB.37.8773 / Phys. Rev. B (1988)
10.1116/1.576265 / J. Vac. Sci. Technol. A (1989)
10.1016/0038-1098(89)90630-3 / Solid State Commun. (1989)
10.1063/1.1721592 / J. Appl. Phys. (1954)
{'key': '2023070215550130900_r11', 'first-page': '259', 'volume': '273', 'year': '1963', 'journal-title': 'Proc. R. Soc. (London) A'} / Proc. R. Soc. (London) A (1963)
10.1063/1.1134581 / Rev. Sci. Instrum. (1976)
10.1063/1.1137466 / Rev. Sci. Instrum. (1983)
{'key': '2023070215550130900_r14'}
{'key': '2023070215550130900_r15'}
10.1063/1.98939 / Appl. Phys. Lett. (1987)
{'key': '2023070215550130900_r17'}
10.1063/1.1139434 / Rev. Sci. Instrum. (1987)
10.1103/PhysRevB.34.1631 / Phys. Rev. B (1986)
10.1063/1.1139213 / Rev. Sci. Instrum. (1986)
10.1063/1.1139596 / Rev. Sci. Instrum. (1987)
{'key': '2023070215550130900_r22'}
10.1088/0508-3443/10/1/306 / Brit. J. Appl. Phys. (1959)
10.2475/ajs.238.8.529 / Am. J. Sci. (1940)
10.1111/j.1151-2916.1955.tb14940.x / J. Am. Ceram. Soc. (1955)
{'key': '2023070215550130900_r26'}

Dates

Type	When
Created	23 years ago (July 26, 2002, 9:19 a.m.)
Deposited	2 years, 1 month ago (July 2, 2023, 11:55 a.m.)
Indexed	11 hours, 5 minutes ago (Aug. 21, 2025, 1:07 p.m.)
Issued	35 years, 6 months ago (Feb. 1, 1990)
Published	35 years, 6 months ago (Feb. 1, 1990)
Published Print	35 years, 6 months ago (Feb. 1, 1990)

Funders 0

None

BibTeX

@article{Cahill_1990, title={Thermal conductivity measurement from 30 to 750 K: the 3ω method}, volume={61}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1141498}, DOI={10.1063/1.1141498}, number={2}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Cahill, David G.}, year={1990}, month=feb, pages={802–808} }

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