DOI: 10.1063/1.1140586. Low-temperature ultrahigh-vacuum scanning tunneling microscope

Low-temperature ultrahigh-vacuum scanning tunneling microscope

10.1063/1.1140586

Crossref journal-article

AIP Publishing

Review of Scientific Instruments (317)

Abstract

We describe a multipurpose scanning tunneling microscope designed to operate in ultrahigh vacuum as well as in air, over a range extending from room temperature to liquid-nitrogen temperatures. It is a single-tube scanner design with a differential flexing approach mechanism mounted on a vibration isolation stack. The instrument features a novel in situ tip and sample exchange mechanism for extended operation under vacuum. A unique characteristic is that the vacuum chamber and all components with the exception of the gas-cooled sample holder are at room temperature. We present preliminary data taken with this instrument, demonstrating atomic resolution constant current, constant height, and multiple-bias imaging, gap-modulated current-voltage spectroscopy or simultaneous topography, and work function measurements, as well as lithography on the surfaces of graphite, Au(111) on mica, and GaAs(110).

Bibliography

Lang, C. A., Dovek, M. M., & Quate, C. F. (1989). Low-temperature ultrahigh-vacuum scanning tunneling microscope. Review of Scientific Instruments, 60(10), 3109â3112.

Authors 3

C. A. Lang (first)
M. M. Dovek (additional)
C. F. Quate (additional)

References 13 Referenced 21

10.1116/1.583920 / J. Vac. Sci. Technol. B (1987)
10.1063/1.96682 / Appl. Phys. Lett. (1986)
10.1103/PhysRevLett.56.1972 / Phys. Rev. Lett. (1986)
{'key': '2024020609223091000_r4', 'first-page': '2630', 'volume': '7', 'year': '1986', 'journal-title': 'Rev. Sci. Instrum.'} / Rev. Sci. Instrum. (1986)
{'key': '2024020609223091000_r5', 'first-page': '211', 'volume': '232', 'year': '1988', 'journal-title': 'Science'} / Science (1988)
10.1063/1.1139957 / Rev. Sci. Instrum. (1988)
10.1063/1.1139196 / Rev. Sci. Instrum. (1986)
10.1116/1.583691 / J. Vac. Sci. Technol. B (1987)
10.1103/PhysRevLett.58.1192 / Phys. Rev. Lett. (1987)
10.1103/PhysRevB.38.4269 / Phys. Rev. B (1988)
10.1103/PhysRevLett.59.2879 / Phys. Rev. Lett. (1987)
10.1063/1.343379 / J. Appl. Phys. (1989)
10.1103/PhysRevLett.62.59 / Phys. Rev. Lett. (1989)

Dates

Type	When
Created	23 years ago (July 26, 2002, 9:17 a.m.)
Deposited	1 year, 6 months ago (Feb. 6, 2024, 4:33 a.m.)
Indexed	3 months ago (May 22, 2025, 2:46 a.m.)
Issued	35 years, 10 months ago (Oct. 1, 1989)
Published	35 years, 10 months ago (Oct. 1, 1989)
Published Print	35 years, 10 months ago (Oct. 1, 1989)

Funders 0

None

BibTeX

@article{Lang_1989, title={Low-temperature ultrahigh-vacuum scanning tunneling microscope}, volume={60}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1140586}, DOI={10.1063/1.1140586}, number={10}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Lang, C. A. and Dovek, M. M. and Quate, C. F.}, year={1989}, month=oct, pages={3109–3112} }

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