Abstract
We report on a new coarse tip distance adjustment and positioner for a scanning tunneling microscope, which was designed with ease of sample manipulation and UHV compatibility in mind. It has no mechanical connections in UHV and has been successfully used for measurements of microfaceted platinum surfaces in air and cleaved Si(111) surfaces under liquids.
References
3
Referenced
162
10.1016/0039-6028(87)90151-8
/ Surf. Sci. (1987){'key': '2024020700142598900_r2'}
{'key': '2024020700142598900_r3', 'first-page': '10c', 'volume': '152', 'year': '1989', 'journal-title': 'J. Microsc.'}
/ J. Microsc. (1989)
Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:22 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 6, 2024, 9:39 p.m.) |
Indexed | 1 month, 3 weeks ago (July 2, 2025, 1:51 p.m.) |
Issued | 36 years, 2 months ago (June 1, 1989) |
Published | 36 years, 2 months ago (June 1, 1989) |
Published Print | 36 years, 2 months ago (June 1, 1989) |
@article{Frohn_1989, title={Coarse tip distance adjustment and positioner for a scanning tunneling microscope}, volume={60}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1140287}, DOI={10.1063/1.1140287}, number={6}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Frohn, J. and Wolf, J. F. and Besocke, K. and Teske, M.}, year={1989}, month=jun, pages={1200–1201} }