Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

Magnetic force microscopy of amorphous compressed Terfenol-D films of micron thickness on both crystalline Si and glassy silica shows that their ferromagnetic domain structure is one dimensional and periodic. On Si the structure is aligned with respect to the easy elastic direction of the substrate. The square of the domain period is proportional to the thickness of the film. All facts indicate that the domain morphology in these films is determined by a substantial elastic contribution to the domain wall and film/substrate interaction energies.

Bibliography

Su, Q., Zheng, Y., Roytburd, A., & Wuttig, M. (1995). Substrate stress controlled magnetic domains in amorphous Terfenol-D films. Applied Physics Letters, 66(18), 2424–2426.

Authors 4
  1. Quanmin Su (first)
  2. Y. Zheng (additional)
  3. A. Roytburd (additional)
  4. Manfred Wuttig (additional)
References 15 Referenced 10
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Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 8:58 a.m.)
Deposited 1 year, 7 months ago (Feb. 3, 2024, 3:53 a.m.)
Indexed 1 year, 7 months ago (Feb. 3, 2024, 8:24 a.m.)
Issued 30 years, 4 months ago (May 1, 1995)
Published 30 years, 4 months ago (May 1, 1995)
Published Print 30 years, 4 months ago (May 1, 1995)
Funders 0

None

@article{Su_1995, title={Substrate stress controlled magnetic domains in amorphous Terfenol-D films}, volume={66}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.113961}, DOI={10.1063/1.113961}, number={18}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Su, Quanmin and Zheng, Y. and Roytburd, A. and Wuttig, Manfred}, year={1995}, month=may, pages={2424–2426} }