Abstract
A new high-pressure energy-dispersive x-ray diffraction apparatus is described. Two major features distinguish this system from previous ones: the ability to collect diffraction data from small sample areas subjected to pressures over 1 Mbar and to scan across the sample. This system also has the ability to calibrate the diffraction angle without making any assumptions about the lattice spacings of the sample.
References
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:17 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 5, 2024, 8:31 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 10, 2024, 1:23 p.m.) |
Issued | 38 years, 10 months ago (Oct. 1, 1986) |
Published | 38 years, 10 months ago (Oct. 1, 1986) |
Published Print | 38 years, 10 months ago (Oct. 1, 1986) |
@article{Brister_1986, title={Microcollimated energy-dispersive x-ray diffraction apparatus for studies at megabar pressures with a synchrotron source}, volume={57}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1139059}, DOI={10.1063/1.1139059}, number={10}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Brister, Keith E. and Vohra, Yogesh K. and Ruoff, Arthur L.}, year={1986}, month=oct, pages={2560–2563} }