Abstract
A low-energy electron diffraction (LEED) system using a position-sensitive detector is described. The design requirements for LEED observations are outlined. Most of these requirements are realized in a system incorporating a miniature, movable electron gun and a position-sensitive detector of the resistive anode type, interfaced to a computer. This system has been used to make 128×128 channel digital records of LED patterns. The speed of data acquisition is limited by the detector hardware and is 20 kHz. Records of good quality (0.1° instrumental angular resolving power) can be made by counting 5×105 electrons. Illustrative applications to silicon and tungsten crystal surfaces and prospects for improving the system are described.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:22 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 10, 2024, 4:34 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 11, 2024, 2:55 a.m.) |
Issued | 39 years, 9 months ago (Nov. 1, 1985) |
Published | 39 years, 9 months ago (Nov. 1, 1985) |
Published Print | 39 years, 9 months ago (Nov. 1, 1985) |
@article{McRae_1985, title={Low-energy electron diffraction system using a position-sensitive detector}, volume={56}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1138423}, DOI={10.1063/1.1138423}, number={11}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={McRae, E. G. and Malic, R. A. and Kapilow, D. A.}, year={1985}, month=nov, pages={2077–2083} }