DOI: 10.1063/1.1138206. Magneto-optical ellipsometer

10.1063/1.1138206

Crossref journal-article

AIP Publishing

Review of Scientific Instruments (317)

Abstract

A magneto-optical ellipsometer is described which uses polarization modulation and the longitudinal magneto-optical Kerr effect. The ellipsometer allows a full determination of the optical and magneto-optical constants of magnetic materials, as well as the registration of in-plane hysteresis loops. The latter application is illustrated on a Ni80Fe20 thin-film sample.

Bibliography

Nederpel, P. Q. J., & Martens, J. W. D. (1985). Magneto-optical ellipsometer. Review of Scientific Instruments, 56(5), 687â690.

Authors 2

P. Q. J. Nederpel (first)
J. W. D. Martens (additional)

References 8 Referenced 47

{'key': '2023070203471297600_r1'}
10.1016/0304-8853(84)90109-4 / J. Magn. Magn. (1984)
10.1063/1.1684062 / Rev. Sci. Instrum. (1969)
{'key': '2023070203471297600_r4'}
{'key': '2023070203471297600_r5'}
10.1143/JJAP.2.548 / J. Appl. Phys. Jpn. (1963)
10.1364/AO.18.000813 / Appl. Opt. (1979)
10.1364/JOSA.51.000948 / J. Opt. Soc. Am. (1961)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:22 a.m.)
Deposited	2 years, 1 month ago (July 1, 2023, 11:47 p.m.)
Indexed	1 year, 5 months ago (March 8, 2024, 5:01 p.m.)
Issued	40 years, 4 months ago (May 1, 1985)
Published	40 years, 4 months ago (May 1, 1985)
Published Print	40 years, 4 months ago (May 1, 1985)

Funders 0

None

BibTeX

@article{Nederpel_1985, title={Magneto-optical ellipsometer}, volume={56}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1138206}, DOI={10.1063/1.1138206}, number={5}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Nederpel, P. Q. J. and Martens, J. W. D.}, year={1985}, month=may, pages={687–690} }

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