Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

An experimental study is presented of the output noise in hot-electron superconducting NbN bolometer mixers. Fluctuations of the electron temperature have been shown to be the main source of electrical noise. The rolloff frequency of the spectral noise density corresponds well to the inverse electron temperature relaxation time (≊230 ps). Equivalent noise data have been obtained for the device at a physical temperature within superconducting transition region, and at a somewhat lower physical temperature with the device pumped by 350 GHz radiation to reach the same operating point. The single sideband (SSB) mixer noise temperature due to intrinsic noise mechanisms for the NbN device is estimated to 360 K independent of radiation frequency. A larger critical current density may promote a further reduction of the intrinsic conversion loss of the mixer device.

Bibliography

Ekström, H., & Karasik, B. (1995). Electron temperature fluctuation noise in hot-electron superconducting mixers. Applied Physics Letters, 66(23), 3212–3214.

Authors 2
  1. H. Ekström (first)
  2. B. Karasik (additional)
References 0 Referenced 22

None

Dates
Type When
Created 23 years ago (July 26, 2002, 9:39 a.m.)
Deposited 1 year, 6 months ago (Feb. 3, 2024, 4:04 a.m.)
Indexed 1 year, 4 months ago (April 3, 2024, 9:50 a.m.)
Issued 30 years, 2 months ago (June 5, 1995)
Published 30 years, 2 months ago (June 5, 1995)
Published Print 30 years, 2 months ago (June 5, 1995)
Funders 0

None

@article{Ekstr_m_1995, title={Electron temperature fluctuation noise in hot-electron superconducting mixers}, volume={66}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.113726}, DOI={10.1063/1.113726}, number={23}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Ekström, H. and Karasik, B.}, year={1995}, month=jun, pages={3212–3214} }