Abstract
Measurements are presented on a novel microcalorimeter for the detection of x rays. This detector uses a normal metal film deposited on a thin membrane to absorb x-ray photons. The subsequent temperature rise of the electrons is measured from the current–voltage characteristics of a normal-insulator-superconductor tunnel junction, where part of the absorber forms the normal electrode. A superconducting-quantum-interference-device is used as a low-noise high-bandwidth readout for the junction. We have measured an energy resolution of 22 eV full width at half-maximum and a time constant of 15 μs for a detector operating at 80 mK and having a 0.5 μm thick Au absorber with an area of 100×100 μm2.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 8:46 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 3, 2024, 4:05 a.m.) |
Indexed | 36 minutes ago (Sept. 3, 2025, 5:53 a.m.) |
Issued | 30 years, 2 months ago (June 5, 1995) |
Published | 30 years, 2 months ago (June 5, 1995) |
Published Print | 30 years, 2 months ago (June 5, 1995) |
@article{Nahum_1995, title={Hot-electron microcalorimeters as high-resolution x-ray detectors}, volume={66}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.113723}, DOI={10.1063/1.113723}, number={23}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Nahum, M. and Martinis, John M.}, year={1995}, month=jun, pages={3203–3205} }